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International Conference on Nano-Networks

NanoNet 2009: Nano-Net pp 259–269Cite as

On Wires Holding a Handful of Electrons

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Abstract

When analyzing reliability, wires have in most cases been ignored, with gates (and devices) taking the lion’s share. With scaling, this “only computing fails” approach is not going to be accurate enough as communication (wires) will also start to err. Trying to do justice to wires, this paper details a statistical failure analysis of wires following on the few papers which have made wires’ reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires’ length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to “lower bound”-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for multi-/many-cores and networks-on-chip, as well as forward-looking investigations on emerging nano-architectures.

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Author information

Authors and Affiliations

  1. College of IT, UAE University, Maqam Campus, Bldg. 22, Al Ain, P.O. Box 17551, UAE

    Valeriu Beiu & Walid Ibrahim

  2. Abu Dhabi Educational Council, Abu Dhabi, P.O. Box 36005, UAE

    Rafic Z. Makki

Authors
  1. Valeriu Beiu
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  2. Walid Ibrahim
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  3. Rafic Z. Makki
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Editor information

Editors and Affiliations

  1. Microelectronic Systems Laboratory STI-LSM, Swiss Federal Institute of Technology EPFL, ELD339 Btiment ELD, Station 11, 1015, Lausanne, Switzerland

    Alexandre Schmid

  2. Business Administration, State University of New York,, 310b, 1400 Washington Ave.,, 12222, Albany, NY, USA

    Sanjay Goel

  3. College of Nanoscale Science and Engineering, University of Albany, 12222, Albany, NY, USA

    Wei Wang

  4. College of Information Technology, UAE University, P.O. Box 17555, Al Ain, Abu Dhabi, United Arab Emirates

    Valeriu Beiu

  5. Lausanne EPFL IC ISIM LSI1 INF 333 (Btment INF) Station 14, Swiss Federal Institute of Technology, CH-1015, Lausanne, Switzerland

    Sandro Carrara

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© 2009 ICST Institute for Computer Science, Social Informatics and Telecommunications Engineering

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Beiu, V., Ibrahim, W., Makki, R.Z. (2009). On Wires Holding a Handful of Electrons. In: Schmid, A., Goel, S., Wang, W., Beiu, V., Carrara, S. (eds) Nano-Net. NanoNet 2009. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 20. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-04850-0_34

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  • DOI: https://doi.org/10.1007/978-3-642-04850-0_34

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-04849-4

  • Online ISBN: 978-3-642-04850-0

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