Abstract
Aging effect in next-generation technologies will play a major role in determining system reliability. In particular, wear-out impact due to Negative Bias Temperature Instability (NBTI) will cause an increase in circuit delays of up to 10% in three years [8]. In these systems, NBTI-induced aging can be slowed-down by inserting periods of recovery where the core is functionally idle and gate input is forced to a specific state. This effect can be exploited to impose a given common target lifetime for all the cores. In this paper we present a technique that allows core-wear-out dependent insertion of recovery periods during loop execution in MPSoCs. Performance loss is compensated based on the knowledge of recovery periods. Loop iterations are re-distributed so that cores with longer recovery are allocated less iterations.
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Marongiu, A., Acquaviva, A., Benini, L. (2009). OpenMP Support for NBTI-Induced Aging Tolerance in MPSoCs. In: Guerraoui, R., Petit, F. (eds) Stabilization, Safety, and Security of Distributed Systems. SSS 2009. Lecture Notes in Computer Science, vol 5873. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-05118-0_38
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DOI: https://doi.org/10.1007/978-3-642-05118-0_38
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