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A Test Coverage-Based Model for Predicting Software Fault Content and Location during Multi-phase Functional Testing

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Advances in Software Engineering (ASEA 2009)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 59))

Abstract

In this paper, we present a new test coverage-based model which allows 1) Description of software systems developed through multiple phases of functional testing, a practice common in industry, 2) Description of software systems where either the initial fault distribution is non-uniform with respect to location, or the repair and test and detection process favor certain locations, 3) Description of software systems which exhibit both characteristics.

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References

  1. Vouk, M.A.: Using reliability models during testing with non-operational profile. In: Second Bellcore/Purdue Symposium on Issues in software reliability estimation, pp. 103–110 (1993)

    Google Scholar 

  2. Piwowarski, P., Ohba, M., Caruso, J.: Coverage measurement experience during function test. In: Proceeding of The 15th International Conference on Software Engineering, Baltimore, MD, pp. 287–301 (1993)

    Google Scholar 

  3. Malaiya, Y.K., Li, N., Bieman, J.M., Karcich, R., Skibbe, B.: The relationship between test coverage and reliability. In: Proceeding of The 5th International Symposium on Software Reliability Engineering, Los Alamitos, pp. 186–195 (1994)

    Google Scholar 

  4. Malaiya, Y.K., Li, M.N., Bieman, J.M., Karcich, R.: Software reliability growth with test coverage. IEEE Transactions on Reliability 51(4), 420–426 (2002)

    Article  Google Scholar 

  5. Gokhale, S.S., Trivedi, K.S.: A Time/Structure Based Software Reliability Model. Annals of Software Engineering 8, 85–121 (1999)

    Article  Google Scholar 

  6. Gokhale, S.S., Philip, T., Marinos, P.N., Trivedi, K.S.: Unification of finite failure non-homogeneous Poisson process models through test coverage. In: Proceedings of the International Symposium on Software Reliability Engineering, White Plains, NY, pp. 299–307 (1996)

    Google Scholar 

  7. Pham, H., Zhang, X.: NHPP software reliability and cost models with testing coverage. European Journal of Operational Research 145(2), 443–454 (2003)

    Article  MATH  Google Scholar 

  8. Cai, X., Lyu, M.R.: Software reliability modeling with test coverage: Experimentation and measurement with A fault-tolerant software project. In: Proceedings of the 18th IEEE International Symposium on Software Reliability Engineering, Trollhättan, Sweden, pp. 17–26 (2007)

    Google Scholar 

  9. USNRC, Guidance on Software Reviews for Digital I &C Systems, NUREG 0800 BTP 7-14 (2007)

    Google Scholar 

  10. IEEE, Systems engineering — Application and management of the systems engineering process, IEEE STD 1220 (2005)

    Google Scholar 

  11. Smidts, C.S., Li, M., Shi, Y., Kong, W., Dai, J.: A Large Scale Validation of A Methodology for Assessing Software Quality (under revision). University of Maryland-College Park (2009)

    Google Scholar 

  12. Koru, A.G., Zhang, D., Eman, K.E., Liu, H.: An Investigation into the Functional Form of the Size-Defect Relationship for Software Modules. IEEE Transactions on Software Engineering 35(2), 293–304 (2009)

    Article  Google Scholar 

  13. Shi, Y., Kong, W., Dai, J., Smidts, C.: A Reliability Prediction Method for Safety Critical Systems Based on Test Coverage. In: The 3rd International Conference on Reliability and Safety Engineering, Kharagpur, India (2007)

    Google Scholar 

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© 2009 Springer-Verlag Berlin Heidelberg

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Smidts, C., Shi, Y. (2009). A Test Coverage-Based Model for Predicting Software Fault Content and Location during Multi-phase Functional Testing. In: Ślęzak, D., Kim, Th., Kiumi, A., Jiang, T., Verner, J., Abrahão, S. (eds) Advances in Software Engineering. ASEA 2009. Communications in Computer and Information Science, vol 59. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-10619-4_39

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  • DOI: https://doi.org/10.1007/978-3-642-10619-4_39

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-10618-7

  • Online ISBN: 978-3-642-10619-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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