Abstract
A lot of applications handle XML documents where multiple overlapping hierarchies are necessary and make use of a number of workarounds to force overlaps into the single hierarchy of an XML format. Although these workarounds are transparent to the users, they are very difficult to handle by applications reading into these formats. This paper proposes an approach to document markup based on Semantic Web technologies. Our model allows the same expressiveness as XML and any other hierarchical meta-markup language, and, rather than requiring complex workarounds, allows the explicit expression of overlapping structures in such a way that search and manipulation of these structures does not require any specific tool or language. By simply using mainstream technologies such as OWL and SPARQL, our model – called EARMARK (Extremely Annotational RDF Markup) – can perform rather sophisticated tasks with no special tricks.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
De Rose, S.: Markup Overlap: A Review and a Horse. In: The Proceedings of the Extreme Markup Languages 2004 Conference, Montral, Canada (2004)
Di Iorio, A., Peroni, S., Vitali, F.: Towards markup support for full GODDAGs and beyond: the EARMARK approach. In: The Proceedings of Balisage: The Markup Conference 2009, Montreal, Canada (2009)
Horridge, M., Patel-Schneider, P.: OWL 2 Web Ontology Language: Manchester Syntax. W3C Working Group Note. World Wide Web Consortium (2009), http://www.w3.org/TR/owl2-manchester-syntax/
Huitfeldt, C., Sperberg-McQueen, C.M.: TexMECS: An experimental markup meta-language for complex documents. Working paper of the project Markup Languages for Complex Documents (MLCD). University of Bergen (2001)
Marinelli, P., Vitali, F., Zacchiroli, S.: Towards the unification of formats for overlapping markup. New Review of Hypermedia and Multimedia 14(1), 57–94 (2008)
Peroni, S., Vitali, F.: Annotations with EARMARK for arbitrary, overlapping and out-of order markup. In: The Proceedings of the Document Engineering 2009 Conference, Munich, Germany (2009)
Portier, P., Calabretto, S.: Methodology for the construction of multi-structured documents. In: The Proceedings of Balisage: The Markup Conference 2009, Montral, Canada (2009)
Schmidt, D., Colomb, R.: A data structure for representing multi-version texts online. International Journal of Human-Computer Studies 67(6), 497–514 (2009)
Sperberg-McQueen, C.M., Burnard, L.: TEI P5 Guidelines for Electronic Text Encoding and Interchange. The Association for Computers and the Humanities (2005)
Sperberg-McQueen, C.M., Huitfeldt, C.: GODDAG: A Data Structure for Overlapping Hierarchies. In: King, P., Munson, E.V. (eds.) PODDP 2000 and DDEP 2000. LNCS, vol. 2023, pp. 139–160. Springer, Heidelberg (2004)
Tennison, J., Piez, W.: The Layered Markup and Annotation Language. Paper Presented at the Late Breaking at Extreme Markup, Montreal, Canada (2002)
Tummarello, G., Morbidni, C., Pierazzo, E.: Toward textual encoding based on RDF. In: 9th ICCC Conference on Electronic Publishing, Leuven, Belgium (2005)
W3C OWL Working Group: OWL 2 Web Ontology Language Document Overview. W3C Recommendation. World Wide Web Consortium (2009), http://www.w3.org/TR/2009/REC-owl2-overview-20091027
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2010 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Di Iorio, A., Peroni, S., Vitali, F. (2010). Handling Markup Overlaps Using OWL. In: Cimiano, P., Pinto, H.S. (eds) Knowledge Engineering and Management by the Masses. EKAW 2010. Lecture Notes in Computer Science(), vol 6317. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-16438-5_29
Download citation
DOI: https://doi.org/10.1007/978-3-642-16438-5_29
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-16437-8
Online ISBN: 978-3-642-16438-5
eBook Packages: Computer ScienceComputer Science (R0)