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Satisfiability Certificates Verifiable in Subexponential Time

  • Conference paper
Theory and Applications of Satisfiability Testing - SAT 2011 (SAT 2011)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 6695))

Abstract

It is common to classify satisfiability problems by their time complexity. We consider another complexity measure, namely the length of certificates (witnesses). Our results show that there is a similarity between these two types of complexity if we deal with certificates verifiable in subexponential time. In particular, the well-known result by Impagliazzo and Paturi [IP01] on the dependence of the time complexity of \(k\mbox{\tt-}\mathtt{SAT}\) on k has its counterpart for the certificate complexity: we show that, assuming the exponential time hypothesis (ETH), the certificate complexity of \(k\mbox{\tt-}\mathtt{SAT}\) increases infinitely often as k grows. Another example of time-complexity results that can be translated into the certificate-complexity setting is the results of [CIP06] on the relationship between the complexity of \(k\mbox{\tt-}\mathtt{SAT}\) and the complexity of SAT restricted to formulas of constant clause density. We also consider the certificate complexity of CircuitSAT and observe that if CircuitSAT has subexponential-time verifiable certificates of length cn, where cā€‰<ā€‰1 is a constant and n is the number of inputs, then an unlikely collapse happens (in particular, ETH fails).

Nominated as Best Paper candidate.

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Dantsin, E., Hirsch, E.A. (2011). Satisfiability Certificates Verifiable in Subexponential Time. In: Sakallah, K.A., Simon, L. (eds) Theory and Applications of Satisfiability Testing - SAT 2011. SAT 2011. Lecture Notes in Computer Science, vol 6695. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-21581-0_4

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  • DOI: https://doi.org/10.1007/978-3-642-21581-0_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-21580-3

  • Online ISBN: 978-3-642-21581-0

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