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International Workshop on Advanced Parallel Processing Technologies

APPT 2011: Advanced Parallel Processing Technologies pp 172–185Cite as

MT-Profiler: A Parallel Dynamic Analysis Framework Based on Two-Stage Sampling

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Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 6965))

Abstract

Dynamic instrumentation systems offer a valuable solution for program profiling and analysis, architectural simulation, and bug detection. However, the performance of target programs suffers great losses when they are instrumented by these systems. This issue is mainly caused by the resource contention between the target programs and the instrumentation systems. As multi-core processors are becoming more and more prevalent in modern computing environments, more hardware resource parallelism is provided for software to exploit. In this paper, we propose to leverage the abundant computing resources of multi-core systems to accelerate program instrumentation. We design and implement a Multi-Threaded Profiling framework named MT-Profiler to dynamically characterize parallel programs. The framework creates instrumenting and analysis code slices which can run along with application threads in parallel on different cores. To further reduce the overhead of dynamic instrumentation, MT-profiler employs two-stage sampling scheme with several optimizations. It is implemented on DynamoRIO which is an open-source dynamic instrumentation and runtime code manipulation system. The performance of our MT-Profiler is evaluated by using the NPB3.3 OPENMP test suite. The results demonstrate that the MT-Profiler obtains 3 to 17 times speedup compared with the DynamoRIO perfect profiler while the average accuracy is over 80%.

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Author information

Authors and Affiliations

  1. Service Computing Technology and System Lab Cluster and Grid Computing Lab School of Computer Science and Technology, Huazhong University of Science and Technology, Wuhan, 430074, China

    Zhibin Yu, Weifu Zhang & Xuping Tu

Authors
  1. Zhibin Yu
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  2. Weifu Zhang
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  3. Xuping Tu
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Editor information

Editors and Affiliations

  1. INRIA Saclay, Parc Club Universite, rue Jean Rostand,Batiment G, 91893, Orsay Cedex, France

    Olivier Temam

  2. Department of Computer Science and Engineering, University of Minnesota, 200 Union Street, SE, 55455, Minneapolis, MN, USA

    Pen-Chung Yew

  3. Fudan University, Software Building, 825 Zhangheng Road, 200433, Shanghai, China

    Binyu Zang

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© 2011 Springer-Verlag Berlin Heidelberg

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Yu, Z., Zhang, W., Tu, X. (2011). MT-Profiler: A Parallel Dynamic Analysis Framework Based on Two-Stage Sampling. In: Temam, O., Yew, PC., Zang, B. (eds) Advanced Parallel Processing Technologies. APPT 2011. Lecture Notes in Computer Science, vol 6965. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-24151-2_13

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  • DOI: https://doi.org/10.1007/978-3-642-24151-2_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-24150-5

  • Online ISBN: 978-3-642-24151-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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