Abstract
Lustre is a formal synchronous declarative language widely used for modeling and specifying safety-critical applications in the fields of avionics, transportation, and energy production. In such applications, the testing activity to ensure correctness of the system plays a crucial role in the development process. To enable adequacy measurement of test cases over applications specified in Lustre (or SCADE), a hierarchy of structural coverage criteria for Lustre programs has been recently defined. A drawback with the current definition of the criteria is that they can only be applied for unit testing, i.e., to single modules without calls to other modules. The criteria experiences scalability issues when used over large systems with several modules and calls between modules. We propose an extension to the criteria definition to address this scalability issue. We formally define the extension by introducing an operator to abstract calls to other modules. This extension allows coverage metrics to be applied to industrial-sized software without an exponential blowup in the number of activation conditions. We conduct a preliminary evaluation of the extended criteria using an Alarm Management System.
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
This research work is supported by the SIESTA project (www.siesta-project.com), funded by ANR, the French National Research Foundation.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Benveniste, A., Caspi, P., Edwards, S.A., Halbwachs, N., Le Guernic, P., de Simone, R.: The synchronous languages 12 years later. Proceedings of the IEEE 91(1), 64–83 (2003)
Chilenski, J.J., Miller, S.P.: Applicability of modified condition/decision coverage to software testing 9(5), 193–200 (1994)
DeMillo, R.A.: Test Adequacy and Program Mutation. In: International Conference on Software Engineering, pp. 355–356. Pittsburg, PA (1989)
Halbwachs, N., Caspi, P., Raymond, P., Pilaud, D.: The synchronous data flow programming language lustre. Proceedings of the IEEE 79(9), 1305–1320 (1991)
Halbwachs, N., Lagnier, F., Ratel, C.: Programming and verifying real-time systems by means of the synchronous data-flow language lustre. IEEE Trans. Software Eng. 18(9), 785–793 (1992)
Lakehal, A., Parissis, I.: Structural coverage criteria for lustre/scade programs. Softw. Test., Verif. Reliab. 19(2), 133–154 (2009)
Marre, B., Arnould, A.: Test sequences generation from lustre descriptions: Gatel. In: IEEE International Conference on Automated Software Engineering, Grenoble, France, pp. 229–237 (October 2000)
Papailiopoulou, V., Madani, L., du Bousquet, L., Parissis, I.: Extending structural test coverage criteria for lustre programs with multi-clock operators. In: The 13th International Workshop on Formal Methods for Industrial Critical Systems (FMICS), L’Aquila, Italy (September 2008)
Raymond, P., Nicollin, X., Halbwachs, N., Weber, D.: Automatic testing of reactive systems. In: IEEE Real-Time Systems Symposium, pp. 200–209 (1998)
Woodward, M.R., Hedley, D., Hennell, M.A.: Experience with path analysis and testing of programs. IEEE Trans. Softw. Eng. 6(3), 278–286 (1980)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2011 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Papailiopoulou, V., Rajan, A., Parissis, I. (2011). Structural Test Coverage Criteria for Integration Testing of LUSTRE/SCADE Programs. In: Salaün, G., Schätz, B. (eds) Formal Methods for Industrial Critical Systems. FMICS 2011. Lecture Notes in Computer Science, vol 6959. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-24431-5_8
Download citation
DOI: https://doi.org/10.1007/978-3-642-24431-5_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-24430-8
Online ISBN: 978-3-642-24431-5
eBook Packages: Computer ScienceComputer Science (R0)