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Dual-Energy Electronic Cleansing for Artifact-Free Visualization of the Colon in Fecal-Tagging CT Colonography

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Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 7029))

Abstract

The partial volume effect (PVE) is one of the major causes of the artifacts in electronic cleansing (EC) for fecal-tagging CT colonography (CTC). In this study, we developed a novel dual-energy EC (DC-EC) scheme for minimizing the EC artifacts caused by the PVE. In our approach, the colonic lumen, including air and tagged fecal materials, was first marked by a dual-energy index (DEI). The high DEI value of air and tagged fecal materials provides a means to efficiently differentiate the voxels at the boundary between air and tagged materials from those of the soft-tissue structures that have the DEI value of around zero. As a result, the colonic lumen, including air and tagged materials, could be accurately segmented based on their high DEI values. Our DE-EC scheme was shown to provide an electronically cleansed colon that is free from artifacts caused by the PVE at the air-tagging boundary.

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© 2012 Springer-Verlag Berlin Heidelberg

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Cai, W., Lee, JG., Kim, S.H., Yoshida, H. (2012). Dual-Energy Electronic Cleansing for Artifact-Free Visualization of the Colon in Fecal-Tagging CT Colonography. In: Yoshida, H., Sakas, G., Linguraru, M.G. (eds) Abdominal Imaging. Computational and Clinical Applications. ABD-MICCAI 2011. Lecture Notes in Computer Science, vol 7029. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-28557-8_2

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  • DOI: https://doi.org/10.1007/978-3-642-28557-8_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-28556-1

  • Online ISBN: 978-3-642-28557-8

  • eBook Packages: Computer ScienceComputer Science (R0)

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