Skip to main content

Towards Enabling Outlier Detection in Large, High Dimensional Data Warehouses

  • Conference paper
Book cover Scientific and Statistical Database Management (SSDBM 2012)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 7338))

Abstract

In this work we present a novel framework that permits us to detect outliers in a data warehouse. We extend the commonly used definition of distance-based outliers in order to cope with the large data domains that are typical in dimensional modeling of OLAP datasets. Our techniques utilize a two-level indexing scheme. The first level is based on Locality Sensitivity Hashing (LSH) and allows us to replace range searching, which is very inefficient in high dimensional spaces, with approximate nearest neighbor computations in an intuitive manner. The second level utilizes the Piece-wise Aggregate Approximation (PAA) technique, which substantially reduces the space required for storing the data representations. As will be explained, our method permits incremental updates on the data representation used, which is essential for managing voluminous datasets common in data warehousing applications.

This work was partially supported by the Basic Research Funding Program, Athens University of Economics and Business.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Kimball, R.: The Data Warehouse Toolkit. John Wiley & Sons (1996)

    Google Scholar 

  2. Subramaniam, S., Palpanas, T., Papadopoulos, D., Kalogeraki, V., Gunopulos, D.: Online Outlier Detection in Sensor Data Using Non-Parametric Models. In: VLDB (2006)

    Google Scholar 

  3. Korn, F., Pagel, B.U., Faloutsos, C.: On the ’Dimensionality Curse’ and the ’Self-Similarity Blessing’. IEEE Trans. Knowl. Data Eng. 13(1), 96–111 (2001)

    Article  Google Scholar 

  4. Andoni, A., Indyk, P.: Near-optimal hashing algorithms for approximate nearest neighbor in high dimensions. In: FOCS, pp. 459–468. IEEE Computer Society (2006)

    Google Scholar 

  5. Lv, Q., Josephson, W., Wang, Z., Charikar, M., Li, K.: Multi-Probe LSH: Efficient Indexing for High-Dimensional Similarity Search. In: VLDB, pp. 950–961 (2007)

    Google Scholar 

  6. Georgoulas, K., Kotidis, Y.: Distributed Similarity Estimation using Derived Dimensions. VLDB J. 21(1), 25–50 (2012)

    Article  Google Scholar 

  7. Keogh, E.J., Chakrabarti, K., Pazzani, M.J., Mehrotra, S.: Dimensionality Reduction for Fast Similarity Search in Large Time Series Databases. Knowl. Inf. Syst. 3(3), 263–286 (2001)

    Article  MATH  Google Scholar 

  8. Roussopoulos, N., Kotidis, Y., Roussopoulos, M.: Cubetree: Organization of and Bulk Updates on the Data Cube. In: SIGMOD Conference, pp. 89–99 (1997)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2012 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Georgoulas, K., Kotidis, Y. (2012). Towards Enabling Outlier Detection in Large, High Dimensional Data Warehouses. In: Ailamaki, A., Bowers, S. (eds) Scientific and Statistical Database Management. SSDBM 2012. Lecture Notes in Computer Science, vol 7338. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-31235-9_41

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-31235-9_41

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-31234-2

  • Online ISBN: 978-3-642-31235-9

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics