Abstract
Image structure noise sometimes is a key factor influencing the image quality of hardcopies and widely exists in presswork using halftone technology. This paper describes an algorithm for measuring image structure noise, including moiré and screen dot effect. In order to objectively meter the degree of structure noise, L* spectrum of colorful flat-area patch is mainly utilized to represent the structure noise of images, according to the subtraction principle and frequency prediction algorithm of moiré. With human evaluation and rating, a linear model of structure noise is regressed by moiré index and screen dot index. Finally the high correlation between human rating and metrics proves the effectiveness of the model.
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References
Itoh, T., Sakatani, K.: Noise evaluation metric derived from digital AM halftone image analysis. Journal of Imaging Science and Technology, 133–119 (1999)
Bryngdahl, O.: Characteristics of superposed patterns in optics. Journal of the Optical Society of America, 87–94 (1976)
Kermisch, D., Roetling, P.G.: Fourier spectrum of halftone images. Journal of the optical society of America 65(6), 716–723 (1975)
Kang, H.R.: Digital Color Halftonin. SPIE Press (1999)
Dooley, R.P., Shaw, R.: Noise perception in Electrophotography. Journal of Applied Photographic Engineering, 190–196 (1979)
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© 2012 Springer-Verlag Berlin Heidelberg
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Xia, C., Saito, T., Song, L. (2012). Measurement Algorithm for Image Structure Noise on Hardcopy. In: Zhang, W., Yang, X., Xu, Z., An, P., Liu, Q., Lu, Y. (eds) Advances on Digital Television and Wireless Multimedia Communications. Communications in Computer and Information Science, vol 331. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34595-1_20
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DOI: https://doi.org/10.1007/978-3-642-34595-1_20
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-34594-4
Online ISBN: 978-3-642-34595-1
eBook Packages: Computer ScienceComputer Science (R0)