Abstract
The paper first describes an existing parameter estimation approach used to estimate MOSFET mathematical model parameters. Next, all of the presented algorithms are analyzed with respect to the current multiple core processor architecture design. The parallel equivalents of the presented algorithms are given, including their computational complexities. The presented approach is specific that is uses the multiple-modulus arithmetic of the Residue Number System for solution of sets of linear equations. Finally, the paper shows the scalability of the presented approach and compares the obtained results to the original approach.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
IEEE Computer Society Standards Committee.: IEEE Standard for Floating-Point Arithmetic. ANSI/IEEE STD 754-2008. The Institute of Electrical and Electronics Engineers, Inc. (2008)
Young, D.M., Gregory, R.T.: A Survey of Numerical Mathematics. Addison-Wesley Series in Mathematics, vol. 2. Addison-Wesley Pub. Company, Inc. (1973)
Gregory, R.T., Krishnamurthy, E.V.: Methods and Application of Error-free Computation. Springer (1984)
Lórencz, R., Reckleben, C., Hansen, K.: A Novel Extraction Method for BJT-Parameters. J. Elec. E. 51, 21–29 (2000)
Cheng, Y., Hu, C.: MOSFET Modeling & BSIM3 User’s Guide. Kluwer Academic Publishers (2002)
Slama, B.H., et al.: Relevant Parameters of SPICE3 MOSFET Model for EMC Analysis. In: Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, Austin, Texas, USA, pp. 319–323 (September 2009)
Guyon, I., Elisseeff, A.: An introduction to variable and feature selection. J. Mach. Learn. Res. 3, 1157–1182 (2003)
Zhou, Q., et al.: Parameter extraction for the PSP MOSFET model by the combination of genetic and Levenberg-Marquardt algorithms. In: Proceeding of the International IEEE Conference on Microelectronic Test Structures, pp. 137–142 (2009)
Murakawa, M., et al.: Instruction tables: Lists of instruction latencies, throughputs and micro-operation breakdowns for Intel and AMD CPU’s Towards Automatic Parameter Extraction for Surface-Potential-Based MOSFET Models with the Genetic Algorithm. In: Proceedings of the 2005 Asia South Pacific Design Automation Conference (ASP-DAC 2005), vol. 1, pp. 204–207. IEEE, Shanghai (2005)
Antoun, G., El-Nozahi, M., Fikry, W., Abbas, H.: A hybrid genetic algorithm for MOSFET parameter extraction. In: Proceeding of the IEEE Canadian Conference on Electical and Computer Engineering, vol. 2, pp. 1111–1114 (2003)
Keser, M., Joardar, K.: Genetic Algorithm Based MOSFET Model Parameter Extraction. Technical Proceedings of the 2000 International Conference on Modeling and Simulation of Microsystems, pp. 341–344 (2000)
Li, Y., Cho, Y.Y.: Parallel genetic algorithm for SPICE model parameter extraction. In: 20th Intl. Symposium on Parallel and Distributed Processing (April 2006)
Abbasian, A., et al.: Modeling of MOS Transistors Based on Genetic Algorithm and Simulated Annealing. In: Proceedings of the IEEE International Symposium on Circuits and Systems, vol. 6, pp. 6218–6221 (May 2005)
Ruizhen, L., et al.: Model Parameters Extraction of SOI MOSFETs. In: Proceedings of Intl. Workshop on Junction Technology, Shanghai, China, pp. 240–243 (August 2006)
Picos, R., et al.: MOSFET Parameters Extraction Using Fuzzy Logic Techniques. In: Proceedings of the 6th International Caribbean Conference on Devices, Circuits and Systems, Playa del Carmen, Mexico, pp. 17–21 (April 2006)
Chopde, A., Khandelwal, S., Thakker, R., Patil, M., Anil, K.: Parameter extraction for MOS model 11 using Particle Swarm Optimization. In: Proceedings of International Workshop on Physics of Semiconductor Devices, pp. 253–256 (December 2007)
Thakker, R., Gandhi, N., Patil, M., Anil, K.: Parameter extraction for PSP MOSFET model using particle swarm optimization. In: Proceedings of International Workshop on Physics of Semiconductor Devices, pp. 130–133 (December 2007)
Levenberg, K.: A Method for the Solution of Certain Problems in Least-Squares. Quarterly Applied Mathematics 2, 164–168 (1944)
Marquardt, D.W.: An algorithm for least-squares estimation of nonlinear parameters. Journal of Applied Mathematics 11(2), 431–441 (1963)
Bryant, A.T., et al.: The Use of a Formal Optimisation Procedure in Automatic Parameter Extraction of Power Semiconductor Devices. In: Proceedings of the 34th Annual IEEE Power Electronics Specialists Conference, Acapulco, Mexico, vol. 2, pp. 822–827 (July 2003)
Connor, A.M., Tilley, D.G.: A Tabu search for the optimization of fluid power circuits. Journal of Systems and Control 212(5), 373–381 (1998)
Hestenes, M.R., et al.: Methods of Conjugate Gradients for Solving Linear Systems. Journal of Research of the National Bureau of Standards 49(6), 409–436 (1952)
Zahradnický, T.: MOSFET Parameter Extraction Optimization. PhD thesis, Department of Computer Science and Engineering, Faculty of Electrical Engineering, The Czech Technical University in Prague (February 2010)
Press, W.H., et al.: Numerical Recipes in C, The Art of Scientific Computing, 2nd edn. Cambridge University Press (1999)
Gregory, R.T.: Error-free computation: Why It Is Needed and Methods For Doing It. Robert E. Krieger Publishing Company, Inc. (January 1980)
Morháč, M., Lórencz, R.: A modular system for solving linear equations exactly, I. Architecture and numerical algorithms. Computers and Artificial Intelligence 11, 351–361 (1992)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Zahradnický, T., Lórencz, R. (2013). Architecture of a Parallel MOSFET Parameter Extraction System. In: Kubátová, H., Hochberger, C., Daněk, M., Sick, B. (eds) Architecture of Computing Systems – ARCS 2013. ARCS 2013. Lecture Notes in Computer Science, vol 7767. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36424-2_28
Download citation
DOI: https://doi.org/10.1007/978-3-642-36424-2_28
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-36423-5
Online ISBN: 978-3-642-36424-2
eBook Packages: Computer ScienceComputer Science (R0)