Abstract
In this paper we present the first official version of SAWO, a functional defect classification scheme developed to enable the usage of defect data for Software Process Improvement (SPI) purposes. Defect data is one of the most important, although nowadays perhaps least discussed management information sources for SPI decisions. Applying our scheme, defects can be classified with accuracy needed to generate practical and targeted process improvement suggestions. The SAWO scheme classifies defects on three levels. On the first level, the focus is on software defects in general. The second level focuses on functional defects and the third level brings more detail to the functional level. Further, we present the validation results of SAWO with three software companies’ defect data consisting of 6363 defects.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Fredericks, M., Basili, V.: Using Defect Tracking and Analysis to Improve Software Quality. In: DoD Data & Analysis Center for Software, DACS (1998)
Vinter, O.: Experience-Based Approaches to Process Improvement. In: Proceedings of the 13th International Software Quality Week, San Francisco, USA (2000)
Grady, R.B.: Practical software metrics for project management and process improvement. Prentice Hall, New Jersey (1992)
Bhandari, I., Halliday, M.J., Chaar, J., Chillarege, R., Jones, K., Atkinson, J.S., Lepori-Costello, C., Jasper, P.Y., Tarver, E.D., Lewis, C.C., Yonezawa, M.: In-process improvement through defect data interpretation. IBM Systems Journal 33(1), 182–214 (1994)
Freimut, B.: Developing and using defect classification schemes. Fraunhofer IESE IESE-Report No, 72 (2001)
Raninen, A., Toroi, T., Vainio, H., Ahonen, J.J.: Defect Data Analysis as Input for Software Process Improvement. In: Dieste, O., Jedlitschka, A., Juristo, N. (eds.) PROFES 2012. LNCS, vol. 7343, pp. 3–16. Springer, Heidelberg (2012)
Toroi, T., Raninen, A., Vainio, H.: Using Functional Defect Analysis as an Input for Software Process Improvement: Initial Results. Communications in Computer and Information Science 301, 181–192 (2012)
Beizer, B.: Software Testing Techniques. International Thomson Computer Press (1990)
Humphrey, W.: A discipline for software engineering. Addison-Wesley (2007)
Yin, R.K.: Case study research: Design and methods. Sage publications, INC. (2009)
Cockburn, A.: Williams. L.: The Costs and Benefits of Pair Programming. In: Succi, G., Marchesi, M. (eds.) Extreme Programming Examined, pp. 223–243 (2001)
Zahran, S.: Software process improvement: practical guidelines for business success. Addison-Wesley, Reading (1998)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Toroi, T., Raninen, A., Vainio, H., Väätäinen, L. (2013). Identifying Process Problems with the SAWO Functional Defect Classification Scheme. In: McCaffery, F., O’Connor, R.V., Messnarz, R. (eds) Systems, Software and Services Process Improvement. EuroSPI 2013. Communications in Computer and Information Science, vol 364. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-39179-8_7
Download citation
DOI: https://doi.org/10.1007/978-3-642-39179-8_7
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-39178-1
Online ISBN: 978-3-642-39179-8
eBook Packages: Computer ScienceComputer Science (R0)