Abstract
Classical single stuck-at faults are analyzed as surrogates for any non-classical fault that may have caused an observed failure. Although multiple stuck-at faults are used as an illustrative example of non-classical faults, proposed algorithms are applicable to any other type of fault. Our effect-cause analysis is less complex than existing methods. The diagnostic procedure adds or removes faults from a set of candidate faults based on the observed circuit outputs, using minimal fault simulation, to obtain a small set of suspected faults.
Research supported in part by the National Science Foundation Grant CCF-1116213.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
ATPG and Failure Diagnosis Tools. Mentor Graphics Corp., Wilsonville, OR (2009)
Python Tutorial Release 2.6.3. docs@python.org. Python Software Foundation (2009)
Abramovici, M., Breuer, M.A.: Fault Diagnosis Based on Effect-Cause Analysis: An Introduction. In: Proc. 17th Design Automation Conf., pp. 69–76 (June 1980)
Abramovici, M., Breuer, M.A.: Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis. IEEE Transactions on Computers C-29(6), 451–460 (1980)
Agrawal, V.D., Baik, D.H., Kim, Y.C., Saluja, K.K.: Exclusive Test and Its Applications to Fault Diagnosis. In: Proc. 16th International Conf. VLSI Design, pp. 143–148 (2003)
Alagappan, C.: Dictionary-Less Defect Diagnosis as Real or Surrogate Single Stuck-At Faults. Master’s thesis, Auburn University, Auburn, Alabama (May 2013)
Beckler, M., Blanton, R.D.(S.): On-Chip Diagnosis for Early-Life and Wear-Out Failures. In: Proc. International Test. Conf., pp. 1–10 (November 2012)
Bushnell, M.L., Agrawal, V.D.: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Springer, Boston (2000)
Cox, H., Rajski, J.: A Method of Fault Analysis for Test Generation and Fault Diagnosis. IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems 7(7), 813–833 (1988)
Grimaila, M.R., Lee, S., Dworak, J., Butler, K.M., Stewart, B., Houchins, B., Mathur, V., Park, J., Wang, L.-C., Mercer, M.R.: REDO - Random Excitation and Deterministic Observation - First Commercial Experiment. In: Proc. 17th IEEE VLSI Test Symp., pp. 268–274 (April 1999)
Kofler, M.: Definitive Guide to Excel VBA. Apress, New York (2000)
Millman, S.D., McCluskey, E.J., Acken, J.M.: Diagnosing CMOS Bridging Faults With Stuck-At Fault Dictionaries. In: Proc. International Test. Conf., pp. 860–870 (September 1990)
Reddy, S.M., Pomeranz, I., Kajihara, S.: On the Effects of Test Compaction on Defect Coverage. In: Proc. 14th IEEE VLSI Test Symp., pp. 430–435 (April 1996)
Stroud, C.E.: A Designer’s Guide to Built-in Self-Test. Springer, Boston (2002)
Venkataraman, S., Drummonds, S.B.: POIROT: A Logic Fault Diagnosis Tool and Its Applications. In: Proc. International Test Conf., pp. 253–262 (2000)
Wang, L.C., Williams, T.W., Mercer, M.R.: On Efficiently and Reliably Achieving Low Defective Part Levels. In: Proc. International Test Conf., pp. 616–625 (October 1995)
Zhang, Y., Agrawal, V.D.: An Algorithm for Diagnostic Fault Simulation. In: Proc. 11th Latin-American Test Workshop (LATW), pp. 1–5 (March 2010)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Alagappan, C., Agrawal, V.D. (2013). Defect Diagnosis of Digital Circuits Using Surrogate Faults. In: Gaur, M.S., Zwolinski, M., Laxmi, V., Boolchandani, D., Sing, V., Sing, A.D. (eds) VLSI Design and Test. Communications in Computer and Information Science, vol 382. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-42024-5_44
Download citation
DOI: https://doi.org/10.1007/978-3-642-42024-5_44
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-42023-8
Online ISBN: 978-3-642-42024-5
eBook Packages: Computer ScienceComputer Science (R0)