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Electrostatic Simulation in Dielectric Composite Material by Extended Element-Free Galerkin Method

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AsiaSim 2013 (AsiaSim 2013)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 402))

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Abstract

To investigate applicability of the eXtended Element-Free Galerkin method (X-EFG) to realistic problems, the X-EFG has been applied to an electrostatic problem in a dielectric composite material. Numerical experiments show that the electrostatic potential obtained by the X-EFG is naturally distributed in the dielectric composite material, and the accuracy of the numerical solution obtained by the X-EFG is almost the same as that of the Standard EFG (S-EFG). In addition, the condition numbers of the coefficient matrices of the linear systems generated by the X-EFG are considerably less than those of the S-EFG.

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Itoh, T., Saitoh, A., Ikuno, S., Kamitani, A. (2013). Electrostatic Simulation in Dielectric Composite Material by Extended Element-Free Galerkin Method. In: Tan, G., Yeo, G.K., Turner, S.J., Teo, Y.M. (eds) AsiaSim 2013. AsiaSim 2013. Communications in Computer and Information Science, vol 402. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45037-2_59

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  • DOI: https://doi.org/10.1007/978-3-642-45037-2_59

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-45036-5

  • Online ISBN: 978-3-642-45037-2

  • eBook Packages: Computer ScienceComputer Science (R0)

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