Abstract
Some testing problems in CMOS circuits are presented: Stuck-open and Stuck-on faults, bridging faults, and excessive leakage in dynamic CMOS circuits. It is shown that current consumption of a faulty CMOS circuit is several order of magnitude greater than the fault-free circuit, then consumption measurement may be a powerful mean of testing. Test by consumption measurement provides improvement of controllability and observability of some faults in comparison with logic test.
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© 1987 Springer-Verlag Berlin Heidelberg
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Jacomino, M., Rainard, J.L., David, R. (1987). Fault Detection by Consumption Measurement in CMOS Circuits. In: Belli, F., Görke, W. (eds) Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems. Informatik-Fachberichte, vol 147. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45628-2_8
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DOI: https://doi.org/10.1007/978-3-642-45628-2_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-18294-8
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