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Random Testing of Memories

  • Conference paper
GI — 7. Jahrestagung

Part of the book series: Informatik — Fachberichte ((INFORMATIK,volume 10))

Abstract

Random testing of static memories is studied. Fault detection by simultaneously applying a random input sequence to a network being tested and to a reference network is considered. The present paper is based upon a previous work in which the length of the input sequence to be applied to a combinational circuit, for a given detection quality, is a function of two characteristic parameters: the number of inputs and the detection surface. These two parameters are easily found without detailed analysis of the network.

It is shown that a ROM behaves like a combinational circuit, as far as testing is considered. By analogy, a detection coefficient may likewise be defined for a RAM. Given a detection quality, the detection coefficient depends only on the number of bits in a word contained in the memory but doesn’t depend on the number of words. From this detection coefficient, and the number of inputs of the memory, we quickly obtain the length of the input sequence to be applied.

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References

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Author information

Authors and Affiliations

  1. Laboratoire d’Automatique, Institut National Polytechnique de Grenoble, B.P. 15, 38040, Grenoble-Cédex, France

    Pascale Fosse & René David

Authors
  1. Pascale Fosse
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  2. René David
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Editor information

Editors and Affiliations

  1. Institut für mathematische, Maschinen und Datenverarbeitung (Informatik), Friedrich-Alexander-Universität Erlangen-Nürnberg, Martensstraße 3, 8520, Erlangen, Deutschland

    Hans Jürgen Schneider

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© 1977 Springer-Verlag Berlin · Heidelberg

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Fosse, P., David, R. (1977). Random Testing of Memories. In: Schneider, H.J. (eds) GI — 7. Jahrestagung. Informatik — Fachberichte, vol 10. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-48908-2_9

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  • DOI: https://doi.org/10.1007/978-3-642-48908-2_9

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-08425-9

  • Online ISBN: 978-3-642-48908-2

  • eBook Packages: Springer Book Archive

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