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Mustererkennung 1997 pp 517–524Cite as

Measurement of Fast Rotation by VLSI Circuits

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Part of the book series: Informatik aktuell ((INFORMAT))

Abstract

There exist important problems that require the measurement of very fast motion. Common techniques for motion estimation based on sequences of video images usually fail to deliver the correct results for such problems due to the low video rate. We present an analog VLSI based system that determines motion in real-time. We demonstrate the performance of that system for the case of measuring the rotation speed of a fast rotating platform.

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References

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Author information

Authors and Affiliations

  1. California Institute of Technology, MS 139-74, Pasadena, CA, 91125, USA

    Christof Born & Rainer Deutschmann

  2. Technische Universität München, Germany

    Rainer Deutschmann

Authors
  1. Christof Born
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  2. Rainer Deutschmann
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Editor information

Editors and Affiliations

  1. Institut für Nachrichtentechnik, Technische Universität Braunschweig, Schleinitzstrasse 22, D-38092, Braunschweig, Deutschland

    Erwin Paulus

  2. Institut für Robotik und Prozeßinformatik, Technische Universität Braunschweig, Hamburger Strasse 267, D-38114, Braunschweig, Deutschland

    Friedrich M. Wahl

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© 1997 Springer-Verlag Berlin Heidelberg

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Born, C., Deutschmann, R. (1997). Measurement of Fast Rotation by VLSI Circuits. In: Paulus, E., Wahl, F.M. (eds) Mustererkennung 1997. Informatik aktuell. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-60893-3_56

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  • DOI: https://doi.org/10.1007/978-3-642-60893-3_56

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-63426-3

  • Online ISBN: 978-3-642-60893-3

  • eBook Packages: Springer Book Archive

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