Abstract
Fault injection by heavy-ion radiation from Californium-252 could become a useful method for experimental verification and validation of error handling mechnisms used in computer systems. Heavy ions emitted from Cf-252 have the capacity to cause transient faults and soft errors in integrated circuits. In this paper, results of initial fault injection experiments using the MC6809E 8-bit microprocessor are presented. The purpose of the experiments was to investigate the variation of the error behavior seen on the external buses when the microprocessor chip was irradiated by a Cf-252 source. The variation of the error behavior is imperative for an effective evaluation of error handling mechnisms, e.g. those designed to detect errors caused by a microprocessor. The experiments showed that the errors seen on the external buses of the MC6809E were well spread, both in terms of location and number of bits affected.
This work was supported by the Swedish National Board for Technical Development under contract #86-3585
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
D. P. Siewiorek, V. Kini, H. Mashburn, S. R, McConnel, and M. Tsao, “A Case Study of C. mmp, Cm, and C.vmp: Part 1 - Experiences with Fault Tolerance in Multiprocessor Systems”, Proceedings of the IEEE, Vol. 66 No. 10, October 1978, pp. 1178–1199.
A. Damm, “The Effectiveness of Software Error-Detection Mechanisms in Real- Time Operating Systems,” Digest of Papers, 16th Annual International Symposium on Fault Tolerant Computing (FTCS-16), pp. 171–176, IEEE, Vienna, Austria, June 1986.
U. Gunneflo, J. Karlsson, and J. Torin,.’Evaluation of Error Detection Schemes Using Fault Injection by Heavy-ion Radiation,’ Digest of Papers, 19th Annual International Symposium on Fault- Tolerant Computing (FTCS-19), IEEE, Chicago, IL, June 1989.
G. C. Messenger and M. S. Ash, “The Effects of Radiation on Electronic Systems”, Van Nostrand Reinhold, 1986.
G.R. Grimmett and D. R. Stirzaker, “Probability and Random Processes,” Oxford University Press, 1982.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1989 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Karlsson, J., Gunneflo, U., Torin, J. (1989). The Effects of Heavy-ion Induced Single Event Upsets in the MC6809E Microprocessor. In: Görke, W., Sörensen, H. (eds) Fehlertolerierende Rechensysteme / Fault-tolerant Computing Systems. Informatik-Fachberichte, vol 214. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75002-1_24
Download citation
DOI: https://doi.org/10.1007/978-3-642-75002-1_24
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-51565-4
Online ISBN: 978-3-642-75002-1
eBook Packages: Springer Book Archive