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Mustererkennung 1987 pp 315–319Cite as

XRAY — An Experimental Configuration Expert System for Automatic X-ray Inspection

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Part of the book series: Informatik-Fachberichte ((INFORMATIK,volume 149))

Abstract

An experimental expert system for knowledge based configuration in automatic X-ray inspection is presented. The system is able to select, arrange and adapt image analysis operators according to a given inspection task. Configured analysis sequences are presented, which automatically detect and classify flaws in cast aluminium parts. Planned developments are briefly mentioned.

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References

  1. H.Boerner, H. Strecker, Towards Automated X-Ray Inspection, paper for a special issue of’ IEEE PAMI on Industrial Machine Vision and Computer Vision Technology (to be published)

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  2. B. Neumann, Wissensbasierte Konfigurierung von Bildverarbeitungssystemen, 8. DAGM-Symposium Paderborn, September/Oktober 1986, Informatik-Fachberichte 125, pp. 206 - 218

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  5. Charles L. Forgy, OPS5 User’s Manual, Department of Computer Science, CMU, 1981

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Author information

Authors and Affiliations

  1. Philips GmbH Forschungslaboratorium Hamburg, Vogt-Koelln-Str. 30, 2000, Hamburg 54, Germany

    K. Pfitzner & H. Strecker

Authors
  1. K. Pfitzner
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  2. H. Strecker
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Editor information

Editors and Affiliations

  1. Institut für Nachrichtentechnik, Technische Universität Braunschweig, Schleinitzstraße 23, D-3300, Braunschweig, Deutschland

    Erwin Paulus

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© 1987 Springer-Verlag Berlin Heidelberg

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Pfitzner, K., Strecker, H. (1987). XRAY — An Experimental Configuration Expert System for Automatic X-ray Inspection. In: Paulus, E. (eds) Mustererkennung 1987. Informatik-Fachberichte, vol 149. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-22205-8_78

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  • DOI: https://doi.org/10.1007/978-3-662-22205-8_78

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-18375-4

  • Online ISBN: 978-3-662-22205-8

  • eBook Packages: Springer Book Archive

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