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3D Tensor Reconstruction in X-Ray Dark-Field Tomography

The First Phantom Result

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Part of the book series: Informatik aktuell ((INFORMAT))

Abstract

X-ray dark-field imaging is a novel technique which provides complementary information on structural variation and density fluctuation. It allows to obtain object structures at micrometer scale and also contains information on the orientation of these structures. Since it can be acquired by a conventional X-ray imaging system, dark-field imaging has great potential for medical diagnosis. However, fully recovering 3D orientations in dark-field reconstruction still remains unexplored. In this paper, we propose an improved reconstruction method based on the zero-constrained dark-field reconstruction by Bayer et al. and a simplified principle axes transformation. A well-defined phantom containing representative 3D orientations is reconstructed in our experiment. On average, the structure orientations in the reconstructed volume differ from the ground truth by 9%. Within the boundaries of an object, the error drops to 6%. Application of this method in real diagnosis data can be expected in future.

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References

  1. Kaeppler S, Bayer F, Weber T, et al. Signal decomposition for x-ray dark-field imaging. Lect Notes Computer Sci. 2014;8673:170–7.

    Article  Google Scholar 

  2. Pfeiffer F, Bech M, Bunk O, et al. Hard-x-ray dark-field imaging using a grating interferometer. Nat Mater. 2008;7(2):134–7.

    Article  Google Scholar 

  3. Yashiro W, Terui Y, Kawabata K, et al. On the origin of visibility contrast in x-ray talbot interferometry. Opt Express. 2010;18(16):16890–1.

    Article  Google Scholar 

  4. Michel T, Rieger J, Anton G, et al. On a dark-field signal generated by micrometer-sized calcifications in phase-contrast mammography. Phys Med Biol. 2013;58(8):2713.

    Article  Google Scholar 

  5. Revol V, Kottler C, Kaufmann R, et al. Orientation-selective x-ray dark field imaging of ordered systems. J Appl Phys. 2012;112(11):114903.

    Article  Google Scholar 

  6. Malecki A, Potdevin G, Biernath T, et al. X-ray tensor tomography. Europhys Lett. 2014;105(3):38002.

    Article  Google Scholar 

  7. Bayer FL, Hu S, Maier A, et al. Reconstruction of scalar and vectorial components in x-ray dark-field tomography. Proc Natl Acad Sci USA. 2014;111(35):12699–704.

    Article  Google Scholar 

  8. Modersitzki J. Numerical Methods for Image Registration. OUP Oxford; 2003.

    Google Scholar 

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Correspondence to Shiyang Hu .

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© 2015 Springer-Verlag Berlin Heidelberg

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Hu, S. et al. (2015). 3D Tensor Reconstruction in X-Ray Dark-Field Tomography. In: Handels, H., Deserno, T., Meinzer, HP., Tolxdorff, T. (eds) Bildverarbeitung für die Medizin 2015. Informatik aktuell. Springer Vieweg, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-46224-9_84

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  • DOI: https://doi.org/10.1007/978-3-662-46224-9_84

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  • Publisher Name: Springer Vieweg, Berlin, Heidelberg

  • Print ISBN: 978-3-662-46223-2

  • Online ISBN: 978-3-662-46224-9

  • eBook Packages: Computer Science and Engineering (German Language)

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