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Computer and Information Sciences pp 143–148Cite as

Dependence Analysis for Regression Test Suite Selection and Augmentation

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Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 62))

Abstract

Using dependence analysis for model-based regression test suite (RTS) selection and augmentation from Extended Finite State Machine (EFSM) representations of system requirements is proposed. Given an EFSM representing the requirements of a system under test (SUT) and a set of modifications (i.e., adding, deleting, and changing transitions) on the EFSM, dependencies between transitions in the EFSM are identified. These dependencies capture the effects of the model on the modifications, the effects of the modifications on the model, and the side-effects of the modifications. The proposed method selects and augments a subset of a given test suite to form an RTS by examining dependencies covered by test cases in the given test suite.

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References

  1. Belina, F., and Hogrefe, D. : The CCITT-Specification and Description Language SDL. Computer Networks and ISDN Systems. 16, pp. 311–341 (1989)

    Article  Google Scholar 

  2. Chen, Y., Probert, R. L., Ural, H.: Model-based Regression Test Suite Generation Using Dependence Analysis. In: ISSTA (AMOST)’07, pp. 54–63. London (2007)

    Google Scholar 

  3. Chen, Y., Probert, R. L., Ural, H.: Regression Rest Suite Reduction Using Extended Dependence Analysis. In: ESEC/FSE (SOQUA)’07, pp. 62–69. Dubrovnik (2007)

    Google Scholar 

  4. Chen, Y-P., Probert, R., Ural, H.: Regression Test Suite Reduction Based on SDL Models of System Requirements. Journal of Software Maintenance and Evolution. 21(6), pp. 379–405 (2009)

    Article  Google Scholar 

  5. Gupta, R., Harrold, M.J., Soffa, M.L.: An Approach to Regression Testing Using Slicing. In: ICSM’92, pp. 299–308. Washington DC (1992)

    Google Scholar 

  6. Harrold, M.J., Gupta, R., Soffa, M.L.: A Methodology for Controlling the Size of a Test Suite. ACM Trans. Soft. Eng. Methodology (TOSEM), pp. 270–285. (1993)

    Google Scholar 

  7. Harrold, M.J., Jones, J.A., Li, T., Liang, D.: Regression Test Selection for Java Software. In: OOPSLA’01, pp. 312–326. Tampa Bay, USA (October 2001)

    Google Scholar 

  8. Korel, B., Tahat, L.H., Vaysburg, B.: Model-based Regression Test Reduction Using Dependence Analysis. In: ICSM’02, pp. 214–223. Montréal, Canada (2002)

    Google Scholar 

  9. Rothermel, G., Harrold, M.J.: Analyzing Regression Test Selection Techniques. IEEE Trans. Soft. Eng. 22, pp. 529–551 (Aug. 1996)

    Article  Google Scholar 

  10. Rothermel, G., Harrold, M.J., Dedhia, J.: Regression Test Selection for C++ Software. Journal of Soft. Test, Verification and Reliability. 10(2), pp. 77–109 (2000)

    Article  Google Scholar 

  11. Xie, B.: Requirement-Based Regression Test Suite Reduction Using Dependence Analysis. Master’s Thesis, University of Ottawa, Ottawa, Canada (2005)

    Google Scholar 

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Author information

Authors and Affiliations

  1. SITE, University of Ottawa, 800 King Edward Avenue, Ottawa, Ontario, K1N 6N5, Canada

    Hasan Ural

  2. FENS, Sabanci University, Orhanli Tuzla, 34956, İstanbul, Turkey

    Hüsnü Yenigün

Authors
  1. Hasan Ural
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  2. Hüsnü Yenigün
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Corresponding author

Correspondence to Hasan Ural .

Editor information

Editors and Affiliations

  1. , EEE Dept., Imperial College, Exhibition Road, London, SW72BT, United Kingdom

    Erol Gelenbe

  2. , EEE Dept., Imperial College, Exhibition Rd., London, SW72AZ, United Kingdom

    Ricardo Lent

  3. , EEE Dept., Imperial College, Exhibition Rd., London, SW72AZ, United Kingdom

    Georgia Sakellari

  4. , School of Biomedical Eng., Sci. and Heal, Drexel University, Bossone 702, 3120 Market Street, Philadelphia, 19104, Pennsylvania, USA

    Ahmet Sacan

  5. , Dept. of Computer Engineering, Middle East Technical University, Ankara, 06531, Turkey

    Hakki Toroslu

  6. Fac. Engineering, Dept. Computer Engineering, Middle East Technical University - METU, Ankara, 06531, Turkey

    Adnan Yazici

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© 2011 Springer Science+Business Media B.V.

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Ural, H., Yenigün, H. (2011). Dependence Analysis for Regression Test Suite Selection and Augmentation. In: Gelenbe, E., Lent, R., Sakellari, G., Sacan, A., Toroslu, H., Yazici, A. (eds) Computer and Information Sciences. Lecture Notes in Electrical Engineering, vol 62. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-9794-1_29

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  • DOI: https://doi.org/10.1007/978-90-481-9794-1_29

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-9793-4

  • Online ISBN: 978-90-481-9794-1

  • eBook Packages: EngineeringEngineering (R0)

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