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Bi-level Problem and SMD Assessment Delinquent for Single Impartial Bi-level Optimization

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 546))

Abstract

In this paper, the proposed strategy is versatile such that the paper moreover gives a test suite of twelve test problems, which includes eight unconstrained and four compelled problems. The test suite comprises problems with adaptable variables and necessities, which can be used to survey the limit of the calculations in dealing with bi-levelproblems. To give design results, we have handled the proposed test problems using a settled bi-level transformative calculation. The results can be used for examination, while evaluating the execution of some other bi-level streamlining calculation.

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Correspondence to Srinivas Vadali , Deekshitulu G.V.S.R. or Murthy J.V.R. .

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Vadali, S., G.V.S.R., D., J.V.R., M. (2017). Bi-level Problem and SMD Assessment Delinquent for Single Impartial Bi-level Optimization. In: Deep, K., et al. Proceedings of Sixth International Conference on Soft Computing for Problem Solving. Advances in Intelligent Systems and Computing, vol 546. Springer, Singapore. https://doi.org/10.1007/978-981-10-3322-3_6

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  • DOI: https://doi.org/10.1007/978-981-10-3322-3_6

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-3321-6

  • Online ISBN: 978-981-10-3322-3

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