Abstract
Scan based diagnosis plays a critical role in failure mode analysis for yield improvement. However, as the logic circuitry associated with scan chains constitute a significant fraction of a chip’s total area the scan chain itself can be subject to defects. In some cases, it has been observed that scan chain failures may account up to \(50\%\) of total chip failures. Hence, scan chain testing and diagnosis have become very crucial in recent years. This paper proposes a hardware-assisted low complexity and area efficient scan chain diagnosis technique. The proposed technique is simple to implement and provides maximum diagnostic resolution for stuck-at faults. The proposed technique can be further extended to diagnose scan chain’s timing faults.
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References
Huang, Y., Guo, R., Cheng, W.T., Li, J.C.M.: Survey of scan chain diagnosis. IEEE Des. Test Comput. 25(3), 240–248 (2008)
Guo, R., Venkataraman, S.: An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (TCAD) 25(9), 1861–1868 (2006)
Kundu, S.: On diagnosis of faults in a scan-chain. In: The 11th Annual IEEE VLSI Test Symposium on Digest of Papers, (VTS), pp. 303–308, April 1993
Stanley, K.: High-accuracy flush-and-scan software diagnostic. IEEE Des. Test Comput. 18(6), 56–62 (2001)
De, K., Gunda, A.: Failure analysis for full-scan circuits. In: Proceedings of IEEE International Test Conference (ITC), pp. 636–645, October 1995
Song, P., Stellari, F., Xia, T., Weger, A.J.: A novel scan chain diagnostics technique based on light emission from leakage current. In: Proceedings of International Test Conference (ITC), pp. 140–147, October 2004
Stellari, F., Song, P., Xia, T., Weger, A.J.: Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements. In: 30th International Symposium for Testing and Failure Analysis (ISTFA), pp. 52–57 (2004)
Edirisooriya, S., Edirisooriya, G.: Diagnosis of scan path failures. In: Proceedings of the 13th IEEE VLSI Test Symposium (VTS), pp. 250–255, April 1995
Schafer, J.L., Policastri, F.A., McNulty, R.J.: Partner srls for improved shift register diagnostics. In: Digest of Papers, 10th Anniversary of IEEE VLSI Test Symposium (VTS), pp. 198–201, April 1992
Narayanan, S., Das, A.: An efficient scheme to diagnose scan chains. In: Proceedings of International Test Conference (ITC), pp. 704–713, November 1997
Wu, Y.: Diagnosis of scan chain failures. In: Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223), pp. 217–222, November 1998
Dounavi, H.M., Tsiatouhas, Y.: Stuck-at fault diagnosis in scan chains. In: Proceedings of the 9th IEEE International Conference on Design Technology of Integrated Systems in Nanoscale Era (DTIS), pp. 1–6, May 2014
Ahlawat, S., Vaghani, D., Gulve, R., Singh, V.: A Low Cost Technique for Scan Chain Diagnosis. In: Proceedings of the 50th IEEE International Symposium on Circuits and Systems (ISCAS), 28–31 May 2017
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Ahlawat, S., Vaghani, D., Tudu, J., Suhag, A. (2017). A Cost Effective Technique for Diagnosis of Scan Chain Faults. In: Kaushik, B., Dasgupta, S., Singh, V. (eds) VLSI Design and Test. VDAT 2017. Communications in Computer and Information Science, vol 711. Springer, Singapore. https://doi.org/10.1007/978-981-10-7470-7_20
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DOI: https://doi.org/10.1007/978-981-10-7470-7_20
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