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Design of Integrated Circuit Chip Fault Diagnosis System Based on Neural Network

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Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1257))

Abstract

This paper focused on the application of neural network in fault diagnosis and its implementation on FPGA. The function of the feature parameter processing module is to process the feature parameters into a form suitable for the input of the neural network model. The feature parameter processing module includes a receiving algorithm, a digital signal processing algorithm, a Kalman filtering algorithm, and a dispersion normalization algorithm, all of which are designed using Verilog language and implemented on an FPGA. The function of the neural network diagnosis module is to analyze the feature parameters and predict the failure state of the system to be tested; the neural network diagnosis module includes a neural network training platform and a feedforward neural network model, wherein the neural network training platform is designed using Python language and implemented by software; The feedforward neural network model is designed using Verilog language and implemented on an FPGA. The test results show that when the number of training exceeds 2000 times, the failure state diagnosis is more than 97% stable for the high-temperature failure diagnosis accuracy of the CMOS static memory cell circuit and the JFM4VSX55RT FPGA.

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References

  1. Fengshuang, L., Hengjing, Z.: Current status and development prospects of astronaut large scale integrated circuit assurance technology. Chin. Aerosp. 06, 29–32 (2017)

    Google Scholar 

  2. Patel, H., Thakkar, A., Pandya, M., et al.: Neural network with deep learning architectures. J. Inf. Optim. Sci. 39(1), 31–38 (2018)

    MathSciNet  Google Scholar 

  3. Licheng, J., Shuyuan, Y., Fang, L., Shigang, W., Zhiwei, F.: Neural network for seventy years: retrospect and prospect. Chin. J. Comput. 39(08), 1697–1716 (2016)

    MathSciNet  Google Scholar 

  4. Du, T., Zhai, A., Wang, P., Li, Y., Li, P.: An integrated circuit PHM model based on BP neural network. Comput. Eng. Sci. 39(01), 55–60 (2017)

    Google Scholar 

  5. Shen, H., Wang, Z., Gao, C., Qin, J., Yao, F., Xu, W.: Determination of the number of hidden layer elements in BP neural network. J. Tianjin Univ. Technol. 05, 13–15 (2008)

    Google Scholar 

  6. Tian, X.C., Li, J., Fan, Y.B., Yu, X.N., Liu, J.: Design and implementation of SPI communication based-on FPGA. Adv. Mater. Res. 291–294, 2658–2661 (2011)

    Article  Google Scholar 

  7. Khamankar, R.B., McPherson, J.W.: Molecular model for intrinsic time- dependent dielectric breakdown in SiO2 dielectrics and the reliability implications for hyper-thin gate oxide. Semicond. Sci. Technol. 15(5), 462–470 (2000)

    Article  Google Scholar 

  8. Mahapatra, S., Kumar, P.B., Alam, M.A.: Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs. IEEE Trans. Electron Devices 51(9), 1371–1379 (2004)

    Article  Google Scholar 

  9. Jian, S.L., Jiang, J.F., Lu, K., Zhang, Y.P.: SEU-tolerant restricted Boltzmann machine learning on DSP-based fault detection. In: International Conference on Signal Processing. IEEE (2014)

    Google Scholar 

  10. Chen, B., Li, J.: Research on fault diagnosis in wireless sensor network based on improved wavelet neural network. Acta Technica (2016)

    Google Scholar 

  11. He, F.J., Wang, Y.H., Ding, G.Q., Fei, Y.Z.: Radar circuit fault diagnosis based on improved wavelet neural network. Appl. Mech. Mater. 651–653, 1084–1087 (2014)

    Article  Google Scholar 

  12. Rimer, M., Martinez, T.: Softprop: softmax neural network backpropagation learning. In: IEEE International Joint Conference on Neural Networks. IEEE (2004)

    Google Scholar 

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Correspondence to Xinsheng Wang .

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Wang, X., Qi, X., Sun, B. (2020). Design of Integrated Circuit Chip Fault Diagnosis System Based on Neural Network. In: Zeng, J., Jing, W., Song, X., Lu, Z. (eds) Data Science. ICPCSEE 2020. Communications in Computer and Information Science, vol 1257. Springer, Singapore. https://doi.org/10.1007/978-981-15-7981-3_14

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  • DOI: https://doi.org/10.1007/978-981-15-7981-3_14

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-15-7980-6

  • Online ISBN: 978-981-15-7981-3

  • eBook Packages: Computer ScienceComputer Science (R0)

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