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A Defect Detection Method for Small Fittings of Power Transmission Based on Improved SLIC

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Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1766))

Abstract

There are a large number of small-sized hardware such as nuts, washers and pins in power transmission equipment. The inspection image of power transmission has high resolution and large image size, which makes it difficult to detect defects distributed on such small-sized hardware. This is a major pain point in transmission line inspections. In response to this pain point, Ontology researches a defect detection model for small power transmission fittings based on improved SLIC (Simple Linear Iterative Clustering) and ViT (Vision Transformer). First, the improved SLIC is used to perform superpixel segmentation and clustering on the image, highlighting the position of small fittings in the entire image, and then using the visual Transformer deep learning network trains and learns the inspection images collected by drones at the power transmission inspection site, and obtains a model capable of stably and accurately identifying the defects of small power transmission fittings. The experimental results show that the method proposed in this paper can efficiently identify the defects of small power transmission fittings under the premise of ensuring stability, with an average recognition accuracy rate of 89.2%, which has high practicability and improves the detection and identification ability of small fittings defects.

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Acknowledgment

This work was funded by the “Research on the key technology of intelligent annotation of power image based on image self-learning” program of the Big Data Center, State Grid Corporation of China.

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Correspondence to Zhenyu Chen .

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Chen, Z., Wang, L., Chen, S., Ren, J., Xue, M. (2023). A Defect Detection Method for Small Fittings of Power Transmission Based on Improved SLIC. In: Zhai, G., Zhou, J., Yang, H., Yang, X., An, P., Wang, J. (eds) Digital Multimedia Communications. IFTC 2022. Communications in Computer and Information Science, vol 1766. Springer, Singapore. https://doi.org/10.1007/978-981-99-0856-1_35

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  • DOI: https://doi.org/10.1007/978-981-99-0856-1_35

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-99-0855-4

  • Online ISBN: 978-981-99-0856-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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