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BIDES: A BIST design expert system

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Abstract

BIDES is an expert system for incorporating BIST into a hardware design that is described in VHDL. Based on the BILBO technique, the BIDES system allocates pseudorandom pattern generators and signature analysis registers to each combinational logic module in a design in such a way that given constraints on testing time and hardware overhead are satisfied. This assignment is performed using the iterative process of regeneration and evaluation of various BIST implementations. In order to effectively perform regeneration, an abstraction hierarchy for a BIST design is introduced and a hierarchical planning technique is employed using this structure. This formulation also leads to an easily modifiable system. Prolog is used for implementing the system.

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References

  1. B. Koenemann, J. Mucha, and G. Zwiehoff, “Built-In Logic Block Observation Techniques,” Proc. IEEE Intern. Test Conf., pp. 37–41, 1979.

  2. J. Kalinowki, A. Albicki, and J. Beausang, “Test Control Signal Distribution in Self-Testing VLSI Circuits,” Proc. Intern. Conf. Comput.-Aid. Design, pp. 60–63, 1986.

  3. F.P. Beucler and M.J. Manner, “HILDO: The Highly Integrated Logic Device Observer,” VLSI Design, pp. 88–96, June 1984.

  4. J.W. Gannett, “Self-Testing by Integrated Feedback (STIF),” VLSI Electronics, N.G. Eisnpruch (Ed.), Academic Press, San Diego, CA, pp. 107–110, 1986.

    Google Scholar 

  5. K. Kim, D.S. Ha, and J.G. Tront, “On Using Signature Registers as Pseudorandom Pattern Generators in BIST,” IEEE Trans. Comput.-Aid. Design 7:919–928, August 1988.

    Google Scholar 

  6. M.S. Abadir and M.A. Breuer, “A Knowledge-Based System for Designing Testable VLSI Chips,” IEEE Design Test Comput., 2(4):56–58, 1985.

    Google Scholar 

  7. K. Kim, J.G. Tront, and D.S. Ha, “Automatic Insertion of BIST Hardware Using VHDL,” Proc. 25th Design Autom. Conf., pp. 9–15, 1988.

  8. M.A. Jones and K. Baker, “An Intelligent Knowledge-Based System Tool for High-Level BIST Design,” Proc. IEEE Intern. Test Conf.,, pp. 743–746, 1985.

  9. P.W. Horstmann, “A Knowledge-Based System Using Design for Testability Rules,” Proc. 14th Intern. Symp. Fault-Tolerant Comput. pp. 278–284, June 1984.

  10. H.S. Fung and S. Hirschhorn, “An Automatic DFT System for the SILC Silicon Compiler,” IEEE Design Test Comput. pp. 45–57, February 1986.

  11. T.E. Mangir, “EXACT: An Expert System for Testable Design of VLSI,” Intern. Symp. VLSI Tech., Systems Applic., May 1985.

  12. A. Kransniewski and A. Albicki, “Automatic Design of Exhaustively Self-Testing Chips with BILBO Modules,” Proc. IEEE Intern. Test Conf., pp. 362–371, 1985.

  13. A.P. Ambler et al., “Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI,” Proc. IEEE Intern. Test Conf., pp. 232–243, 1986.

  14. P.H. Winston, Artificial Intelligence, Addison-Wesley, Reading, MA, 1984.

    Google Scholar 

  15. K. Kim, Automatic Design of Self-Testable VLSI Circuits, Ph.D. Thesis, June 1989.

  16. P.R. Cohen and E.A. Feigenbaum, The Handbook of Artificial Intelligence, William Kaufmann, Los Altos, CA, 1982.

    Google Scholar 

  17. K. Lin et al., “The TMS320 Family of Digital Signal Processor,” Proc. IEEE, 75:1143–1159, September 1987.

    Google Scholar 

  18. M.S. Abadir and M.A. Breuer, “Test Schedules for VLSI Circuits Having Built-In Test Hardware,” IEEE Trans. Comput. C-35(4):361–367, 1986.

    Google Scholar 

  19. C.R. Kime and K.K. Saluja, “Test Scheduling in Testable VLSI Circuits,” Proc. 12th Intern. Symp. Fault-Tolerant Comput. pp. 406–412, 1982.

  20. M.J. Ohletz, T.W. Williams, and J.P. Mucha, “Overhead in Scan and Self-Testing Designs,” Proc. IEEE Intern. Test Conf., pp. 460–470, 1987.

  21. K. Kim, J.G. Tront, and D.S. Ha, “On Hardware Overhead in CMOS BIST Designs,” Proc. IEEE Southeastcon '89, pp. 671–675, April 1989.

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Now with Samsung Electronics, Chase Plaza Bldg. SF, 34–35 Jeong-Dong, Choong-Ku, Seoul, Korea.

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Kim, K., Tront, J.G. & Ha, D.S. BIDES: A BIST design expert system. J Electron Test 2, 165–179 (1991). https://doi.org/10.1007/BF00133501

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  • DOI: https://doi.org/10.1007/BF00133501

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