Abstract
In this paper, we propose a simple testing technique based on DC measurements for operational amplifiers. We first develop a comprehensive macromodel for the transistor-level opamp to alleviate the efforts of fault simulation. By incorporating appropriate I/O characteristics into the macromodel, the output deviation due to the modeling error can be significantly reduced. We use the transistor short/bridging faults to illustrate the efficiency of our proposed technique. Experimental results show that a high fault coverage can be achieved for the stand-alone opamp by measuring two DC parameters V o-max * and V o-min *. For the embedded opamps, many short/bridging faults cannot be detected by traditional functional testing. However, by using similar DC measurements along with a design for testability (DFT) scheme, we can improve the fault coverage dramatically.
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An earlier version of this work was reported in ICCAD-94.
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Pan, CY., Cheng, KT. & Gupta, S. Fault macromodeling and a testing strategy for opamps. J Electron Test 9, 225–235 (1996). https://doi.org/10.1007/BF00134688
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DOI: https://doi.org/10.1007/BF00134688