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Generation and evaluation of current and logic tests for switch-level sequential circuits

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Abstract

This article presents an approach to developing high quality tests for switch-level circuits using both current and logic test generation algorithms. Faults that are aborted or undetectable by logic tests may be detected by current tests, or vice versa. An efficient switch level test generation algorithm for generating current and logic tests is introduced. Clear definitions for analyzing the effectiveness of the joint test generation approach are derived. Experimental results are presented for demonstrating high coverage of stuck-at, stuck-on, and stuck-open faults for switch level circuits when both current and logic tests are used.

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Authors and Affiliations

  1. Computer Engineering Research Center, The University of Texas at Austin, 2201 Donley Dr., Ste. 395, 78758, Austin, TX, USA

    Chun-Hung Chen & Jacob A. Abraham

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  1. Chun-Hung Chen
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  2. Jacob A. Abraham
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Chen, CH., Abraham, J.A. Generation and evaluation of current and logic tests for switch-level sequential circuits. J Electron Test 3, 359–366 (1992). https://doi.org/10.1007/BF00135339

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  • DOI: https://doi.org/10.1007/BF00135339

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