Abstract
In the absence of information about the layout one is left with no alternative but to consider all bridging faults. An algorithm for diagnosis of a subset of such faults, viz. single two line bridging faults in static CMOS combinational circuits is presented. This algorithm uses results from I DDQ measurement based testing.
Unlike known diagnosis algorithms, this algorithm does not use fault dictionaries, it uses only logic simulation and uses no fault simulation. It also uses SOPS, a novel representation of subsets of two-line bridging faults resulting in an efficient algorithm.
In spite of the large number of faults that we consider, our experimental results point to the computational feasibility of I DDQ Measurement based diagnosis of single two line bridging faults. It also shows the effectiveness of reducing the set of possible faults using I DDQ measurements.
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Research Partially Supported by NSF Grant No. MIP-9102509.
This work was performed when the author was with the Dept. of Computer Science, State University of New York at Buffalo.
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Chakravarty, S., Liu, M. Algorithms for I DDQ measurement based diagnosis of bridging faults. J Electron Test 3, 377–385 (1992). https://doi.org/10.1007/BF00135341
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DOI: https://doi.org/10.1007/BF00135341