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Design of ICs applying built-in current testing

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Abstract

Built-in Current (BIC) sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal I DDQ currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximum level of defect detectability, minimum impact of BIC sensor on the performance of the circuit under test and minimum area overhead needed for BIC sensors implementation.

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Authors and Affiliations

  1. Electrical and Computer Engineering Department, Carnegie Mellon University, 15213, Pittsburgh, PA, USA

    Wojciech Maly & Marek Patyra

Authors
  1. Wojciech Maly
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  2. Marek Patyra
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This research was supported by NSF Grant MIP8822805.

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Maly, W., Patyra, M. Design of ICs applying built-in current testing. J Electron Test 3, 397–406 (1992). https://doi.org/10.1007/BF00135343

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  • DOI: https://doi.org/10.1007/BF00135343

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