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Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis

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Abstract

Fault-tolerant design of analog circuits is more difficult than that of digital circuits. Chatterjee has proposed a continuous checksum-based technique to design fault-tolerant linear analog circuits. However, hardware overhead of the embedded checker is an important issue in this technique, which has never been addressed before. This paper proposes an algorithm for reduction of hardware overhead in the checker. Without changing the original circuit, the proposed algorithm can not only reduce the number of passive elements, but also the number of analog operators so that the error detection circuitry in the checker has optimal hardware overhead. As the basis of the algorithm, a serial of theoretic results, including the concept and existence conditions of all-non-zero solutions, have also been presented to verify the algorithm.

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References

  1. P.K. Lala, Fault Tolerant and Fault Testable Hardware Design, Prentice-Hall International, Englewood Cliffs, N.J., 1985.

    Google Scholar 

  2. G. Russell, Advanced Simulation and Testing Methodologies for VLSI Design, Van Nostrand, London, 1989.

    Google Scholar 

  3. Y. Min and J. Li, “Strongly Fault Secure PLA's and Totally Self-Checking Checkers,” IEEE Transactions on Computers, Vol. 37, No. 7, pp. 863–867, 1988.

    Google Scholar 

  4. M. Soma, “A Design for Test Methodology for Active Analog Filters,” Proceedings of ITC, 1990, pp. 183–191.

  5. Nagi, A. Chatterjee, and J.A. Abraham, “Fault Simulation of Linear Analog Circuits,” Journal of Electronic Testing: Theory and Applications, Vol. 4, No. 4, pp. 345–360, 1993.

    Google Scholar 

  6. B. Hamida and B. Kaminska, “Multiple Fault Analog Circuit Testing by Sensitivity Analysis,” Journal of Electronic Testing: Theory and Applications, Vol. 4, No. 4, pp. 331–344, 1993.

    Google Scholar 

  7. K.H. Huang and J.A. Abraham, “Algorithm-Based Fault Tolerance for Matrix Operations,” IEEE Transactions on Computers, Vol. 33, No. 6, pp. 518–528, 1984.

    Google Scholar 

  8. J.Y. Jou and J.A. Abraham, “Fault-Tolerant Matrix Arithmetic and Signal Processing on Highly Concurrent Computing Structures,” Proceedings of the IEEE, Vol. 74, No. 5, 1986, pp. 732–741.

    Google Scholar 

  9. Reddy and P. Banerjee, “Algorithm-Based Fault Detection for Signal Processing Applications” IEEE Transactions on Computers, Vol. 39, No.10, pp. 1304–1308, 1990.

    Google Scholar 

  10. V.S.S. Nair and J.A. Abraham, “Real-Number Codes for Fault-Tolerant Matrix Operations on Processor Arrays,” IEEE Transactions on Computers, Vol. 39, No. 4, pp. 426–435, 1990.

    Google Scholar 

  11. A. Chatterjee and M.A. d'Abreu, “The Design of Fault-Tolerant Digital State Variable Systems: Theory and Techniques,” IEEE Transactions on Computers, Vol. 42, No. 7, pp. 794–808, 1993.

    Google Scholar 

  12. A. Chatterjee, “Concurrent Error Detection and Fault-Tolerance in Linear Analog Circuits Using Continuous Checksums,” IEEE Transactions on VLSI Systems, Vol. 1, No. 2, pp. 138–150, 1993.

    Google Scholar 

  13. Papoulis, Circuits and Systems: A Modern Approach, Holt Rinehart and Wilston, New York, 1980.

    Google Scholar 

  14. A. Chatterjee, “Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums,” Proceedings of ITC91, 1991, pp. 582–591.

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Zhou, Y., Wong, M.W.T. & Min, Y. Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. J Electron Test 9, 153–163 (1996). https://doi.org/10.1007/BF00137571

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  • DOI: https://doi.org/10.1007/BF00137571

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