Abstract
This paper describes a pseudorandom pattern generator for the random pattern test of combinational circuits. Suppose that a fractionp of the possible patterns detects some fault and the generator generates L patterns to test the circuit. Then the probability that the generator generates a pattern that tests the fault is at leastpL/(pL + 1). The only assumption is that all values of the seed of the generator are equally likely. The seed is twice as long as a single pattern. The generator is less than twice as expensive as a linear feedback shift register. Thus, it can be used in practice. More complicated generators that achieve a better bound are also discussed.
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Communicated by F. Thomson Leighton.
This research was supported in part by the National Science Foundation under Grants CCR-8810609 and CDA-8805910.
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Spencer, T.H. Provably good pattern generators for a random pattern test. Algorithmica 11, 429–442 (1994). https://doi.org/10.1007/BF01293265
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DOI: https://doi.org/10.1007/BF01293265