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Relaxation algorithm of piecing-error for sub-images

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Abstract

During the process of automatic image recognition or automatic reverse design of IC, people often encounter the problem that some sub-images must be pieced together into a whole image. In the traditional piecing algorithm for sub-images, a large accumulated error will be made. In this paper, a relaxation algorithm of piecing-error for sub-images is presented. It can eliminate the accumulated error in the traditional algorithm and greatly improve the quality of pieced image. Based on an initial pieced image, one can continuously adjust the center of every sub-image and its angle to lessen the error between the adjacent sub-images, so the quality of pieced image can be improved. The presented results indicate that the proposed algorithm can dramatically decrease the error while the quality of ultimate pieced image is still acceptable. The time complexity of this algorithm isO(nlnn).

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References

  1. Chen Chunhong, Zhao Wenqing, Tang Pushan. Module placement based on space relaxation.Chinese Journal of Electronics, July, 1996, 5(1): 33–39.

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Authors and Affiliations

  1. Department of Electronics Engineering, Fudan University, 200433, Shanghai, P.R. China

    Li Yueping & Tang Pushan

Authors
  1. Li Yueping
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  2. Tang Pushan
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Corresponding author

Correspondence to Li Yueping.

Additional information

LI Yueping was born in 1976. She received her B.S. degree from Fudan University. Now she is an M.S. candidate in the Department of Electronics Engineering of Fudan University. Her interests concentrate on the VLSI layout algorithms and power estimation.

TANG Pushan was born in 1934. He received his B.S. degree from Fudan University in 1952. Now he is a professor in the Department of Electronics Engineering of Fudan University. His research interests include the VLSI layout, the verification algorithm and NP problem.

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Li, Y., Tang, P. Relaxation algorithm of piecing-error for sub-images. J. Comput. Sci. & Technol. 16, 270–277 (2001). https://doi.org/10.1007/BF02943205

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  • DOI: https://doi.org/10.1007/BF02943205

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