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Quality assurance and machine vision for inspection

  • Part II Computation A Support And Software For FMS, Justification Of FMS, Robotics, Vision, Assembly
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Methods and Tools for Computer Integrated Manufacturing (CIM 1983)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 168))

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4. References

  1. Agin, G. J.: Computer Vision Systems for Industrial Inspection and Assembly, Computer, May 1980, 11–20

    Google Scholar 

  2. Baumann, R. D., Wilmshurst, D. A.: Vision System Sorts Castings at General Motors in Canada, in: Robot Vision (ed. A. Pugh), 255–266, Springer Verlag, New York, 1983

    Google Scholar 

  3. Bittner, J.: Data Independence in CAD/CAM Data Bases, in: CAPE'83 (ed. E. A. Warman), North Holland, 573–587, 1983

    Google Scholar 

  4. Boehm, B. W.: Software Engineering Economics, Prentice Hall, New Jersey, 1981

    Google Scholar 

  5. Bolles, R. C.: Three-Dimensional Locating of Industrial Parts, in: eighth NFS grantees conference on production research and technology, Stanford, California, 1981

    Google Scholar 

  6. Bruhn, H., Felske, A.: Schnelle und automatische Bildanalyse von Specklegrammen mit Hilfe der FFT für Spannungsmessungen

    Google Scholar 

  7. Buxmeyer, E. et all: Serielles Bussystem für industrielle Anwendungen unter Echtzeitbedingungen (PDV-Bus), KFK-PDV 150, 1978 VDI-Berichte Nr. 399, 13–17, 1981

    Google Scholar 

  8. Caulfield, H. J.: Holography: A Reassessment, IEEE spectrum, Aug. 1982, 39–45

    Google Scholar 

  9. Codd, E. F.: Relational Database: A Practical Foundation for Productivity, CACM, Vol. 25, No. 2, 109–117, 1982

    Google Scholar 

  10. Fu, K. S.: Pattern Recognition for Automated Visual Inspection, Computer, Dec. 1982, 34–40

    Google Scholar 

  11. Giebel, H.: Nichtlineares Filtersystem zur Bildvorverarbeitung, BMFT-FB-DV83-001,1983

    Google Scholar 

  12. Gonzales, R. C., Safabakhsh, R.: Computer Vision Techniques for Industrial Applications and Robot Control, Computer, Dec. 1982, 17–32

    Google Scholar 

  13. Herzog, K.: Zeiss Multi-Coordinate Metrology, Hardware-Software Application, reprint from Zeiss Information 91, Carl Zeiss Company, Oberkochen, W. Germany, 1980

    Google Scholar 

  14. Horn, B. K., Sjoberg, R. W.: Calculating the Reflectance Map, Applied Optics, Vol. 18, No. 11, 1770–1779, 1979

    Google Scholar 

  15. Jarvis, J. F.: Research Directions in Industrial Machine Vision: A Workshop Summary, Computer, Dec. 1982, 55–61

    Google Scholar 

  16. Kelly, R. B.: Pose Refinement Vision, proc. of the 2nd international conference on robot vision and sensory control, 379–388, 1982

    Google Scholar 

  17. Knoll, G. F.: Radiation Detection and Measurement, John Wiley & Sons, New York, 1979

    Google Scholar 

  18. Levi, P.: The System Architecture of Data Aquisition Networks, Euromicro Journal, Vol. 5, No. 6, 350–357, 1979

    Google Scholar 

  19. Levi, P.: Betriebssysteme für Realzeitanwendungen, Data Kontext Verlag, Cologne, 1981

    Google Scholar 

  20. Levi, P.: Transaction Language Characteristics and User/Computer Interface in Manufacturing Systems, Microprocessors and Microsystems, Vol. 7, No. 1, 3–17, 1983

    Google Scholar 

  21. Levi, P., Weirich, E.: Differential Reflectance Functions and Their Use for Surface Identification, in: proceedings of 13th ISIR/ROBOTS 7 symposium, 17.61–17.77, 1983

    Google Scholar 

  22. Levi, P.: Laser-Abstandsmessungen: Industrieroboter lernen räumlich sehen, Elektronik 12, 83–86, 1983

    Google Scholar 

  23. Lockemann, P. C., Mayr, H. C.: Rechner-gestützte Informationssysteme, Springer Verlag, Berlin, Heidelberg, 1978

    Google Scholar 

  24. Martini, P., Nehr, G.: MOBIP: Ein modulares Bildverarbeitungssystem mit Parallelrechner, Elektronische Rechenanlagen, 25. Jahrgang, Heft 2, 55–65, 1983

    Google Scholar 

  25. APT 360., Reference Data, Mc Donnell Douglas, U.S.A., 1980

    Google Scholar 

  26. Mergler, H. W.: In-Process Optical Gauging for Numerical Machine Tool, in: 6th NFS grantees conference on production research and industrial automation, West Lafayette, India, 1978

    Google Scholar 

  27. Nagy, G.: Optical Scanning Digitizer, Computer, May 1983, 13–24

    Google Scholar 

  28. Nawrath, R. F. et all: Visual Inspection and Quality Control by TAS, proc. of the 5th international conference on automated inspection and product control, 115–124, 1980

    Google Scholar 

  29. Nehr, G., Martini, P.: The Coupling of a Workpiece Recognition System with an Industrial Robot, in: Robot Vision (ed. A. Pugh), 83–96, Springer Verlag, New York, 1983

    Google Scholar 

  30. Niemann, H.: Pattern Analysis, Springer Verlag, New York, 1981

    Google Scholar 

  31. Nitzan, D. et all: The Measurements and Use of Registered Reflectance and Range Data in Scene Analysis, Proc. of IEEE, Vol. 65, No. 2, 206–220, 1977

    Google Scholar 

  32. Paulus, T. J.: High Speed Timing Electronics and Applications of Hybrid Electronics in Nuclear Instrumentation, Electronic Devision, ORTEC, Oak Ridge, 1982

    Google Scholar 

  33. Rembold, U.: Prozess-und Mikrorechnersysteme, Oldenbourg Verlag, Munich, 1979

    Google Scholar 

  34. Rembold, U., Blume, C., Dillmann, R.: Computer Integrated Manufacturing, CAD/CAM, to be published, Marcel Dekker Publishing Company, New York, Basel, 1983

    Google Scholar 

  35. Rohde, A.: Application of an Image Analyser in Quality Control, proc. of the 2nd international conference on robot vision and sensory control, 53–61, 1982

    Google Scholar 

  36. Rosen, C. A.: Machine Vision and Robotics: Industrial Requirements, in: Computer Vision and Sensor-Based Robots (eds. G. Dodd, L. Rossol), Plenum Press, New York, 3–20, 1979

    Google Scholar 

  37. Schnupp, P.: Rechnernetze, Walter de Gruyter Verlag, Berlin, New York, 1982

    Google Scholar 

  38. Strohbach, K.: Rechnergestützte Qualitätssicherung, in: Fachseminar 3 zur FATEMA'82, Kernforschungszentrum Karlsruhe, 1982

    Google Scholar 

  39. Thierauf, R. J.: Distributed Processing Systems, Prentice-Hall, New Jersey, 1979

    Google Scholar 

  40. Tsichritzis, D.: Form Management, CACM, Vol. 25, No. 7, 453–478, 1982

    Google Scholar 

  41. Vollath, D.: Das Bildanalysesystem PACOS, Praktische Metallographie, Band 19, H. 1, 7–23, H. 2, 94–103, 1982

    Google Scholar 

  42. Warnecke, H. J.: Production Systems with Automated Information and Material Flow-State of the Art and Applications, in: CAPE'83 (ed. E. A. Warman), North Holland, 23–40, 1983

    Google Scholar 

  43. Wasmund, H.: Automatische Produktionskontrolle und Materialprüfung, in: Erfassung und maschinelle Verarbeitung von Bilddaten (ed. H. Kazmierczak), 245–256, Springer Verlag, Berlin, Heidelberg, 1980

    Google Scholar 

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U. Rembold R. Dillmann

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Levi, P. (1984). Quality assurance and machine vision for inspection. In: Rembold, U., Dillmann, R. (eds) Methods and Tools for Computer Integrated Manufacturing. CIM 1983. Lecture Notes in Computer Science, vol 168. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0014787

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  • DOI: https://doi.org/10.1007/BFb0014787

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