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Software package for reflection high energy electron diffraction beam intensity measurement and analysis system

  • Conference paper
  • First Online:
High-Performance Computing and Networking (HPCN-Europe 1994)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 796))

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Abstract

The three packages of software for reflection high energy electron diffraction are described. There are one window, four windows and line-like options for different applications in molecular beam epitaxial growth processes, surface phenomena and diffraction features investigations.

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References

  1. J.M.Van Hove, P.R.Pukite, P.I.Cohen. J.Vac.Sci.Technol B., v.1, p.741 (1983).

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  2. G.E.Cirlin, G.M.Guryanov, N.N.Ledentsov, Yu.B.Samsonenko. Abs. 14th General Conference of Condensed Matter Division of EPS, Madrid, 1994 (accepted).

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Authors and Affiliations

  1. Institute for Analytical Instrumentation, Russia Academy of Sciences, Rizhsky 26, 198103, St. Petersburg, Russia

    G. E. Cirlin, G. M. Guryanov, N. P. Korneeva & Yu. B. Samsonenko

Authors
  1. G. E. Cirlin
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  2. G. M. Guryanov
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  3. N. P. Korneeva
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  4. Yu. B. Samsonenko
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Editor information

Wolfgang Gentzsch Uwe Harms

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© 1994 Springer-Verlag Berlin Heidelberg

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Cirlin, G.E., Guryanov, G.M., Korneeva, N.P., Samsonenko, Y.B. (1994). Software package for reflection high energy electron diffraction beam intensity measurement and analysis system. In: Gentzsch, W., Harms, U. (eds) High-Performance Computing and Networking. HPCN-Europe 1994. Lecture Notes in Computer Science, vol 796. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0020402

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  • DOI: https://doi.org/10.1007/BFb0020402

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-57980-9

  • Online ISBN: 978-3-540-48406-6

  • eBook Packages: Springer Book Archive

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