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Aegean Workshop on Computing

AWOC 1988: VLSI Algorithms and Architectures pp 257–267Cite as

A new algorithm for wiring layouts

  • VLSI Layout
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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 319))

Abstract

In this paper we present a new algorithm for wiring layouts in the square grid. This algorithm provides a rather intuitive proof that the number of layers required to wire a given layout W is at most four, and it constructs a two-layer wiring if and only if W requires two layers. The algorithm runs in O(N) time, where N is the number of grid points occupied by the layout. The technique used here can be extended in order to construct wirings of layouts in the tri-hexagonal grid that use at most five layers.

This research was performed while the author was with the Coordinated Science Lab., University of Illinois, Urbana, IL 61801, and was supported in part by the Semiconductor Research Corporation under contract RSCH 84-06-049-6.

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References

  1. M.L. Brady and D.J. Brown, “VLSI ROUTING: Four Layers Suffice,” pp. 245–257 in Advances in Computing Research, vol. 2, ed. F.P. Preparata, JAI Press Inc., 1984.

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  8. I.G. Tollis, “Algorithms for VLSI Layout,” Ph.D. Thesis, Department of Computer Science, Technical Report ACT-85, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1987.

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  9. I.G. Tollis, “Wiring Eayouts in the Octo-Square Grid and Two-Colorable Maps,” Manuscript, Urbana, 1987.

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Author information

Authors and Affiliations

  1. Department of Computer Science, The University of Texas at Dallas, P.O. Box 830688, FN 3.3, 75083-0688, Richardson, TX

    Ioannis G. Tollis

Authors
  1. Ioannis G. Tollis
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John H. Reif

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© 1988 Springer-Verlag Berlin Heidelberg

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Tollis, I.G. (1988). A new algorithm for wiring layouts. In: Reif, J.H. (eds) VLSI Algorithms and Architectures. AWOC 1988. Lecture Notes in Computer Science, vol 319. Springer, New York, NY. https://doi.org/10.1007/BFb0040393

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  • DOI: https://doi.org/10.1007/BFb0040393

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-0-387-96818-6

  • Online ISBN: 978-0-387-34770-7

  • eBook Packages: Springer Book Archive

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