Abstract
This work presents a testing technique based on ‘Kolmogorov–Smirnov’ (K–S) test for detection of parametric faults in analog circuits. The proposed method is a time-domain signal processing technique that compares the statistical similarity in terms of ‘Empirical Cumulative Distribution Function’ (ECDF) of the outputs of the circuit when the input of the circuit is a random analog signal. ‘Multivariate Adaptive Regression Splines’ (MARS) technique is used to map the tolerances of functional metrics to the components of the circuit under test (CUT). Two benchmark circuits, i.e., second-order Sallen–Key band-pass filter and weakly nonlinear cascade amplifier are tested to validate the proposed fault detection technique. The proposed statistical approach with the use of random analog signal as input excitation results reduction of complexity for designing input test signal and increases fault coverage in the analog circuit testing. The proposed method is testified experimentally for Sallen–Key band-pass filter. The experimental results are in good agreement with the simulated results.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
L.J. Bain, M. Engelhardt, Introduction to Probability and Mathematical Statistics (Duxbury Press, Belmont, 1995)
A. Chatterjee, N. Nagi, Design for testability and built-in self-test of mixed-signal circuits: a tutorial. in 10th International Conference on VLSI Design (IEEE 1997), pp 388–392
CRAN. URL https://cran.r-project.org
Y. Cui, J. Shi, Z. Wang, Analog circuits fault diagnosis using multi-valued fisher’s fuzzy decision tree (mffdt). Int. J. Circuit Theory Appl. 44(1), 240–260 (2016)
H. Dai, T.M. Souders, Time-domain testing strategies and fault diagnosis for analog systems. IEEE Trans. Instrum. Meas. 39(1), 157–162 (1990)
H. Eissa, R.F. Salem, A. Arafa, S. Hany, A. El-Mously, M. Dessouky, D. Nairn, M. Anis, Parametric dfm solution for analog circuits: electrical-driven hotspot detection, analysis, and correction flow. IEEE Trans. Very Large Scale Integr. Syst. 21(5), 807–820 (2013)
J.H. Friedman, Multivariate adaptive regression splines. Ann. Stat. 19(1), 1–67 (1991)
K. Ghosh, B. Ray, Design of a new high order ota-c filter structure and its specification based testing. in 18th International Symposium on VLSI Design and Test (IEEE 2014), pp 1–6
K. Ghosh, A. Roy, S. Mondal, B. Ray, Parametric deviation based analog test and diagnosis system. J. Circuits Syst. Comput. 20(07), 1323–1340 (2011)
T. Gonzales, S. Sahni, W. Franta, An effcient approximate algorithm for the kolmogorov-smirnov and lilliefors tests. J. Stat. Comput. Simul. 6(3–4), 257–263 (1978)
Z. Guo, J. Savir, Coefficient-based test of parametric faults in analog circuits. IEEE Trans. Instrum. Meas. 55(1), 150–157 (2006)
S.D. Huynh, S. Kim, M. Soma, J. Zhang, Automatic analog test signal generation using multifrequency analysis. IEEE Trans. Circuits Syst II Analog Digital Signal Process 46(5), 565–576 (1999)
P. Kalpana, K. Gunavathi, Wavelet based fault detection in analog vlsi circuits using neural networks. Appl. Soft Comput. 8(4), 1592–1598 (2008)
A. Kavithamani, V. Manikandan, N. Devarajan, Analog circuit fault detection using location of poles. J. Electron. Test. 27(5), 673 (2011)
A. Kavithamani, V. Manikandan, N. Devarajan, Soft fault classification of analog circuits using network parameters and neural networks. J. Electron. Test. 29(2), 237–240 (2013)
S. Krishnan, H.G. Kerkhoff, Exploiting multiple mahalanobis distance metrics to screen outliers from analog product manufacturing test responses. IEEE Des. Test 30(3), 18–24 (2013)
X. Li, Y. Xie, Analog circuits fault detection using cross-entropy approach. J. Electron. Test. 29(1), 115–120 (2013)
C.Y. Pan, K.T. Cheng, Pseudorandom testing for mixed-signal circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(10), 1173–1185 (1997)
M. J. Panik, Advanced Satistics from an Elementary Point of View (Academic Press, Cambridge, 2005)
J. Park, H. Shin, J.A. Abraham, Pseudorandom test of nonlinear analog and mixed-signal circuits based on a volterra series model. J. Electron. Test. 27(3), 321 (2011)
H. Shin, G. S. Yu, J. A. Abraham, LFSR-based bist for analog circuits using slope detection. in 14th Great Lakes Symposium on VLSI (ACM 2004), pp 316–321
S. Sindia, V. Singh, V. D. Agrawal, Polynomial coefficient based dc testing of non-linear analog circuits. in 19th Great Lakes Symposium on VLSI (ACM, 2009) pp 69–74
S. Sindia, V. D. Agrawal, V. Singh, Test and diagnosis of analog circuits using moment generating functions. in Asian Test Symposium (IEEE 2011), pp 371–376
S.J. Spinks, C.D. Chalk, I.M. Bell, M. Zwolinski, Generation and verification of tests for analog circuits subject to process parameter deviations. J. Electron. Test. 20(1), 11–23 (2004)
S. Srimani, M.K. Parai, K. Ghosh, H. Rahaman, Parametric fault detection of analog circuits based on Bhattacharyya measure. Analog Integr. Circ. Sig. Process 93(3), 477–488 (2017)
P.N. Variyam, S. Cherubal, A. Chatterjee, Prediction of analog performance parameters using fast transient testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3), 49–361 (2002)
W. Zhang, A.T. Goh, Multivariate adaptive regression splines and neural network models for prediction of pile drivability. Geosci. Front. 7(1), 45–52 (2016)
Acknowledgments
This work is supported by Special Manpower Development Program for Chips to System Design (SMDP-C2SD) of Ministry of Electronics & Information Technology, Government of India. S. Srimani thankfully acknowledges Visvesvaraya PhD Scheme of Ministry of Electronics & Information Technology, Government of India for his fellowship for pursuing Ph.D.
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Srimani, S., Parai, M., Ghosh, K. et al. A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method. Circuits Syst Signal Process 40, 2091–2113 (2021). https://doi.org/10.1007/s00034-020-01572-x
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00034-020-01572-x