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Multiresolution model based extraction of product feature lines in reverse engineering

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Abstract

In this paper, multiresolution models are employed in the context of reverse engineering for feature line extraction. Starting with a proper triangulation of the cloud point data as a priori, our feature line extraction algorithm has three steps: (1) establishing a Gauss normal sphere and creating multiresolution models for the Gauss sphere based on different levels of subdivisions for the sphere regions; (2) mapping the unit normal vectors of triangular faces in the multiresolution Gauss sphere and merging those connected triangular faces whose unit normal vectors fallen on the same Gauss sphere region with a given resolution to form super-faces (the collection of triangular facets with similar normal); and (3) extracting the boundaries from the super-faces and generating the feature lines from the extracted boundaries. We then use these feature lines as a base for tracing boundary curves for B-spline surface construction. Since feature lines maintain the characteristics of the original product models, in this way, we have a good chance to reconstruct B-spline surfaces with high quality. Examples are given in the paper to show the feature line extraction, the influence of the feature lines extracted under different resolutions, and the final reconstructed B-spline surfaces based on these feature lines.

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Acknowledgements

This research was sponsored by the China NSF under grants no. 602720601 and no. 60073026, and the China Ministry of Science and Technology under grant no. 2003AA4Z1020. The authors would like to thank the anonymous reviewers for their kind comments.

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Authors and Affiliations

  1. College of Computer Science and State Key Lab of CAD/CG, Zhejiang University, 310027, Hangzhou, China

    Zhiyang Chen, Wei Peng, Lili He & Xiuzi Ye

  2. SolidWorks Corporation, 300 Baker Avenue, Concord, MA, 01742, USA

    Xiuzi Ye

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  1. Zhiyang Chen
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  2. Wei Peng
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  3. Lili He
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  4. Xiuzi Ye
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Correspondence to Xiuzi Ye.

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Chen, Z., Peng, W., He, L. et al. Multiresolution model based extraction of product feature lines in reverse engineering. Engineering with Computers 19, 264–270 (2004). https://doi.org/10.1007/s00366-003-0266-y

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