Abstract
Multi-scale analysis has been widely used for constructing texture descriptors by modeling the coefficients in transformed domains. However, the resulting descriptors are not robust to the rotated textures when performing texture classification. To alleviate this problem, we in this paper propose a multi-scale counting and difference representation (CDR) of image textures for texture classification. Particularly, we first extract a single-scale CDR feature consisting of the local counting vector (LCV) and the differential excitation vector (DEV). The LCV is established to capture different types of textural structures using the discrete local counting projection, while the DEV is used to describe the difference information of textures in accordance with the differential excitation projection. Finally, the multi-scale CDR feature of a texture image is constructed by combining CDRs at different scales. Experimental results on Brodatz, VisTex, and Outex databases demonstrate that our proposed multi-scale CDR-based texture classification method outperforms five representative texture classification methods.
Similar content being viewed by others
References
Zhang, J., Liang, J., Zhao, H.: Local energy pattern for texture classification using self-adaptive quantization thresholds. IEEE Trans. Image Process. 22(1), 34–42 (2013)
Pun, C.M., Lee, M.C.: Log-polar wavelet energy signatures for rotation and scale invariant texture classification. IEEE Trans. Pattern Anal. Mach. Intell. 25(5), 590–603 (2003)
Liu, L., Fieguth, P.: Texture classification from random features. IEEE Trans. Pattern Anal. Mach. Intell. 34(3), 574–586 (2012)
Po, D.D.Y., Do, M.N.: Directional multiscale modeling of images using the contourlet transform. IEEE Trans. Image Process. 15(6), 1610–1620 (2006)
Do, M.N., Vetterli, M.: Wavelet-based texture retrieval using generalized Gaussian density and Kullback–Leibler distance. IEEE Trans. Image Process. 11(2), 146–158 (2002)
Li, L., Tong, C., Choy, S.K.: Texture classification using refined histogram. IEEE Trans. Image Process. 19(5), 1371–1378 (2010)
Li, Z., Liu, G., Yang, Y., You, J.: Scale- and rotation-invariant local binary pattern using scale-adaptive texton and subuniform-based circular shift. IEEE Trans. Image Process. 21(4), 2130–2140 (2012)
Qi, X., Xiao, R., Li, C., Qiao, Y., Guo, J., Tang, X.: Pairwise rotation invariant co-occurrence local binary pattern. IEEE Trans. Pattern Anal. Mach. Intell. 36(11), 2199–2213 (2014)
Amirolad, A., Arashloo, S.R., Amirani, M.C.: Multi-layer local energy patterns for texture representation and classification. Vis. Comput. 32(12), 1633–1644 (2016)
Choy, S.K., Tong, C.: Statistical properties of bit-plane probability model and its application in supervised texture classification. IEEE Trans. Image Process. 17(8), 1399–1405 (2008)
Selvan, S., Ramakrishnan, S.: SVD-based modeling for image texture classification using wavelet transformation. IEEE Trans. Image Process. 16(11), 2688–2696 (2007)
Lategahn, H., Gross, S., Stehle, T., Aach, T.: Texture classification by modeling joint distributions of local patterns with Gaussian mixtures. IEEE Trans. Image Process. 19(6), 1548–1557 (2010)
Du, H., Jin, X., Willis, P.J.: Two-level joint local laplacian texture filtering. Vis. Comput. 32(5), 1537–1548 (2016)
Pi, M., Tong, C., Choy, S.K., Zhang, H.: A fast and effective model for wavelet subband histograms and its application in texture image retrieval. IEEE Trans. Image Process. 15(10), 3078–3088 (2006)
Dong, Y., Ma, J.: Texture classification based on contourlet subband clustering. In: 7th International Conference on Intelligent Computing, pp. 421–426. Zhengzhou (2011)
Giachetti, A., Isaia, L., Garro, V.: Multiscale descriptors and metric learning for human body shape retrieval. Vis. Comput. 32(6), 693–703 (2016)
Lin, C., Liu, C., Chen, H.: Image retrieval and classification using adaptive local binary patterns based on texture features. IET Image Process. 6(7), 822–830 (2012)
Subrahmanyam, M., Maheshwari, R.P., Balasubramanian, R.: Local tetra patterns: a new feature descriptor for content-based image retrieval. IEEE Trans. Image Process. 21(5), 510–514 (2011)
Shi, Y., Yi, Y., Yan, H., Dai, J., Zhang, M., Kong, J.: Region contrast and supervised locality-preserving projection-based saliency detection. Vis. Comput. 31(10), 1191–1205 (2015)
Luo, G., Cordier, F., Seo, H.: Spacial-temporal segmentation for the similarity measurement of deforming meshes. Vis. Comput. 32(10), 243–256 (2016)
Zhao, L., Zhang, Y., Yin, B., et al.: Fisher discrimination-based \(l_{2,1}\)-norm sparse representation for face recognition. Vis. Comput. 32(9), 1165–1178 (2016)
Ma, M., Peng, S., Hu, X.: A lighting robust fitting approach of 3D morphable model for face reconstruction. Vis. Comput. 32(9), 1223–1238 (2016)
Takallou, M.H., Kasaei, S.: Multiview face recognition based on multilinear decomposition and pose manifold. IET Image Process. 8(5), 300–309 (2014)
Tan, X., Triggs, B.: Enhanced local texture feature sets for face recognition under difficult lighting conditions. IEEE Trans. Image Process. 19(6), 1635–1650 (2010)
Dash, K.S., Puhan, N.B., Panda, G.: Handwritten numeral recognition using non-redundant Stockwell transform and bio-inspired optimal zoning. IET Image Process. 9(10), 874–882 (2015)
Zhao, G., Ahonen, T., Matas, J., Pietikäinen, M.: Rotation-invariant image and video description with local binary pattern features. IEEE Trans. Image Process 21(4), 1465–1477 (2011)
Dong, Y., Ma, J.: Bayesian texture classification based on contourlet transform and BYY harmony learning of Poisson mixtures. IEEE Trans. Image Process. 21(3), 909–918 (2012)
Dong, Y., Ma, J.: Wavelet-based image texture classification using local energy histograms. IEEE Trans. Signal Process. Lett. 18(4), 247–250 (2011)
Dong, Y., Ma, J.: Feature extraction through contourlet subband clustering for texture classification. Neurocomputing 116, 157–164 (2013)
Dong, Y., Tao, D., Li, X., Ma, J., Pu, J.: Texture classification and retrieval using shearlets and linear regression. IEEE Trans. Cybern. 45(3), 358–369 (2015)
Garnavi, R., Aldeen, M., Bailey, J.: Computer-aided diagnosis of melanoma using border- and wavelet-based texture analysis. IEEE Trans. Inf. Technol. Biomed. 16(6), 1239–1252 (2012)
Ji, H., Yang, X., Ling, H., Xu, Y.: Wavelet domain multifractal analysis for static and dynamic texture classification. IEEE Trans. Image Process 22(1), 286–299 (2013)
Ojala, T., Pietikaèinen, M., Maèenpaèa, T.: Multiresolution gray-scale and rotation invariant texture classification with local binary patterns. IEEE Trans. Pattern Anal. Mach. Intell. 24(7), 971–984 (2002)
Feng, J., Dong, Y., Liang, L., Pu, J.: Dominant-completed local binary pattern for texture classification. In: IEEE 4th ICIA, pp. 233-238. Lijiang (2015)
Sebastian, H., Andreas, U.: A scale- and orientation-adaptive extension of local binary patterns for texture classification. Pattern Recognit. 48(8), 2633–2644 (2015)
Guo, Z., Zhang, L., Zhang, D.: Rotation invariant texture classification using LBP variance (LBPV) with global matching. Pattern Recognit. 43(3), 706–719 (2010)
Liao, S., Law, M.W.K., Chung, A.C.S.: Dominant local binary patterns for texture classification. IEEE Trans. Image Process. 18(5), 1107–1118 (2009)
Guo, Z., Zhang, L., Zhang, D.: A completed modeling of local binary pattern operator for texture classification. IEEE Trans. Image Process. 19(6), 1657–1663 (2010)
Zhao, Y., Huang, D., Jia, W.: Completed local binary count for rotation invariant texture classification. IEEE Trans. Image Process. 21(10), 4492–4497 (2012)
Chen, J., Shan, S., He, C., Zhao, G., et al.: WLD: a robust local image descriptor. IEEE Trans. Pattern Analy. Mach. Intell. 32(9), 1705–1720 (2010)
Liu, F., Tang, Z., Tang, J.: WLBP: weber local binary pattern for local image description. Neurocomputing 120, 1705–1720 (2013)
Ryu, J.B., Hong, S., Yang, H.: Sorted consecutive local binary pattern for texture classification. IEEE Trans. Image Process. 24(7), 2254–2265 (2015)
Liu, L., Long, Y., Fieguth, P.W., Lao, S., Zhao, G.: BRINT: binary rotation invariant and noise tolerant texture classification. IEEE Trans. Image Process. 23(7), 3071–3084 (2014)
Ren, J., Jiang, X., Yuan, J.: Noise-resistant local binary pattern with an embedded error-correction mechanism. IEEE Trans. Image Process. 22(10), 4049–4060 (2013)
Acknowledgements
This work was supported in part by the National Natural Science Foundation of China under Grant U1604153, and in part by the International Science and Technology Cooperation Project of Henan Province under Grant 162102410021.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Dong, Y., Feng, J., Yang, C. et al. Multi-scale counting and difference representation for texture classification. Vis Comput 34, 1315–1324 (2018). https://doi.org/10.1007/s00371-017-1415-4
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00371-017-1415-4