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Transient fault detectors

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Abstract

We present fault detectors for transient faults, (i.e., corruptions of the memory of the processors, but not of the code of the processors). We distinguish fault detectors for tasks (i.e., the problem to be solved) from failure detectors for implementations (i.e., the algorithm that solves the problem). The aim of our fault detectors is to detect a memory corruption as soon as possible. We study the amount of memory needed by the fault detectors for some specific tasks, and give bounds for each task. The amount of memory is related to the size and the number of views that a processor has to maintain to ensure a quick detection. This work may give the implementation designer hints concerning the techniques and resources that are required for implementing a task.

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Authors and Affiliations

  1. University of Paris Sud, LRI-CNRS 8623, INRIA Grand Large, 91405, Orsay, France

    Joffroy Beauquier & Sébastien Tixeuil

  2. University of Paris Sud, LRI-CNRS 8623, 91405, Orsay, France

    Sylvie Delaët

  3. Department of Mathematics and Computer Science, Ben-Gurion University, Beer-Sheva, 84105, Israel

    Shlomi Dolev

Authors
  1. Joffroy Beauquier
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  2. Sylvie Delaët
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  3. Shlomi Dolev
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  4. Sébastien Tixeuil
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Corresponding author

Correspondence to Joffroy Beauquier.

Additional information

An extended abstract of this paper was presented at the 12th International Symposium on DIStributed Computing (DISC’98). Shlomi Dolev is partly supported by the Israeli Ministry of Science and Arts grant #6756195. Part of this research was done while Shlomi Dolev was visiting the Laboratoire de Recherche en Informatique (LRI), University of Paris Sud.

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Beauquier, J., Delaët, S., Dolev, S. et al. Transient fault detectors. Distrib. Comput. 20, 39–51 (2007). https://doi.org/10.1007/s00446-007-0029-x

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  • DOI: https://doi.org/10.1007/s00446-007-0029-x

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