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Testing the Supermodular-Cut Condition

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Abstract

For a function \(f:2^{V} \to \mathbb {Z}_{+}\) on a finite set V with f(∅)=f(V)=0, a digraph D=(V,A) is called f-connected if it satisfies the f-cut condition, that is, δ D (X)≥f(X) for any XV, where δ D (X) is the number of arcs from X to VX. We show that, for any crossing supermodular function f, the f-connectivity can be tested with a constant number of queries in the general digraph model with average degree bound. As immediate corollaries, we obtain constant-time testers for k-edge-connectivity, rooted-(k,l)-edge-connectivity, and the property of having k arc-disjoint arborescences. We also give a corresponding result for the undirected case.

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Acknowledgements

We thank anonymous referees for helpful comments and simpler proofs of Lemmas 1 and 2. Shin-ichi Tanigawa is supported by JSPS Grant-in-Aid for Scientific Research (B). Yuichi Yoshida is supported by JSPS Grant-in-Aid for Research Activity Start-up (24800082), MEXT Grant-in-Aid for Scientific Research on Innovative Areas (24106001), and JST, ERATO, Kawarabayashi Large Graph Project.

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Correspondence to Yuichi Yoshida.

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Tanigawa, SI., Yoshida, Y. Testing the Supermodular-Cut Condition. Algorithmica 71, 1065–1075 (2015). https://doi.org/10.1007/s00453-013-9842-8

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  • DOI: https://doi.org/10.1007/s00453-013-9842-8

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