Abstract
Although deep neural networks have made great success in several scenarios of machine learning, they face persistent challenges in small training datasets learning scenarios. Few-shot learning aims to learn from a few labeled examples. However, the limited training samples and weakly distinguishable embedding vectors in a metric space often lead to unsatisfactory test results and directly calculating the distance between tensors can cause ambiguity. This paper proposes an embedded adaptive cross-modulation (EACM) method for few-shot learning which combines the information between support and query examples. Specifically, the inter-class categorizability between the support set prototype representations is enhanced by the adaptive cosine metric module to improve the accuracy of the few-shot recognition result. The learning is performed by using the cross-modulation module at many levels of abstraction layers along the prediction pipeline. The support set and query set feature cross-enhance, which improves the generalization ability and robustness of image recognition. Afterward, we further combine above two methods by a weight balance scalar to determine the task-related metric space and construct a joint loss function. Theoretical analysis demonstrates the generalization ability of EACM. We conduct comprehensive experiments on mini-ImageNet and CUB datasets. Experimental results show that our approach is the state-of-the-art approach by significant margins.
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Acknowledgements
Funding was provided by National Natural Science Foundation of China (Grant Nos. U1713213, 61772508), National Key R&D Program of China (2018YFB1308000), National Natural Science Foundation of China (U1713213, 61772508), Key Research and Development Program of Guangdong Province [grant numbers 2019B090915001], Shenzhen Technology Project (JCYJ20180507182610734, JCYJ20170413152535587), CAS Key Technology Talent Program.
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Wang, P., Cheng, J., Hao, F. et al. Embedded adaptive cross-modulation neural network for few-shot learning. Neural Comput & Applic 32, 5505–5515 (2020). https://doi.org/10.1007/s00521-019-04605-y
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DOI: https://doi.org/10.1007/s00521-019-04605-y