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The metal thickness detection using pulsed eddy-current computation and detection method

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Abstract

Through detecting method of pulsed eddy-current (PEC) and according to thickness testing model of multi-layer metal, infer the mathematical model of eddy current testing method in single-layer metal. Use Maxwell field equations to find solutions of vector magnetic potential in its boundary conditions thus infer the impedance of hollow coil placed right above metal. Analyze the variation relationship between induced current and metal thickness in theory level. (1) Obtain three characteristic signals of induced current: altitude of current peak value (ACPV), time of reaching current peak (TRCP) and time of traversing zero point (TTZP). The thickness of the metal and the distance between the metal and coil were obtained. (2) Introduce the concept of the lift-off intersection point (LOI) and puts forward a new method of metal thickness detection based on the LOI. By analyzing the results of the experiment, it confirms the feasibility of the LOI of measurement in the metal thickness.

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Acknowledgements

This work was financially supported by National Nature Science Foundation of China (Grant Nos. 51478383, 5120916, 51678470), National Program on Key Research SUB-Project (Grant No. 2017YFC0704207-03), Youth Science and Technology Project of Shaanxi Province (Grant No. 2016KJXX-64), Science and technology project of Xi’an (Grant No. JKDZ0011), Science and technology project of Xi’an BEI LIN (Grant No. GX1705).

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Authors and Affiliations

  1. Department of Info and Automation, Xi’an University of Architecture and Technology, Xi’an, 710055, China

    Liang Zhao, Chu-Jun Li, Zhong-Xing Duan & Xiao-Dong Wu

  2. School of Civil Engineering, Xi’an University of Architecture and Technology, Xi’an, 710055, China

    Wei Wang

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  1. Liang Zhao
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  2. Chu-Jun Li
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  3. Zhong-Xing Duan
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  4. Wei Wang
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  5. Xiao-Dong Wu
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Correspondence to Zhong-Xing Duan.

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Zhao, L., Li, CJ., Duan, ZX. et al. The metal thickness detection using pulsed eddy-current computation and detection method. Cluster Comput 22 (Suppl 3), 6551–6562 (2019). https://doi.org/10.1007/s10586-018-2335-4

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