Abstract
Phase shifters are used in conjunction with Linear Feedback Shift Registers and Cellular Automata in order to impose sufficient channel separations on the bit sequences produced by their successive cells. The aim is to reduce structural correlations and/or linear dependencies that are problematic for pseudorandom and pseudoexhaustive built-in test pattern generation (TPG). In this paper we present a synthesis approach that merges the logic of the original TPG mechanism with that of the required phase shifter network and yields a new compact structure that can offer lower area overhead and improved frequency of operation than the existing approach.
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Dimitri Kagaris received the Diploma degree in Computer Engineering and Informatics from the University of Patras, Greece, in 1988, and the M.S. and Ph.D. degrees in Computer Science from Dartmouth College, Hanover, New Hampshire, in 1991 and 1994, respectively. He is currently an Associate Professor in the Electrical & Computer Engineering Department, Southern Illinois University at Carbondale. His research interests include digital design automation, test pattern generation and design for testability, and computer networks.
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Kagaris, D. Phase Shifter Merging. J Electron Test 21, 161–168 (2005). https://doi.org/10.1007/s10836-005-6145-2
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DOI: https://doi.org/10.1007/s10836-005-6145-2