Abstract
A security extension for IEEE Std 1149.1 is proposed. It provides a locking mechanism which prevents unauthorised users to interfere via test bus with the system normal operation. The security extension requires small hardware overhead and allows full conformance with IEEE Std 1149.1.
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References
“IEEE Standard for In-System Configuration of Programmable Devices”, IEEE Std 1532-2002, Institute of Electrical and Electronics Engineers, ISBN: 0738135070, 01-Dec, 2002.
“IEEE Standard Test Access Port and Boundary-Scan Architecture”, IEEE Std 1149.1-2001, Institute of Electrical and Electronics Engineers, ISBN: 0738129445, 14-Jun, 2001.
N.G. Jacobson, “Intest security circuit for boundary-scan architecture”, United States Patent 6,499,124, December 24, 2002.
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Editor: K. K. Saluja
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Novak, F., Biasizzo, A. Security Extension for IEEE Std 1149.1. J Electron Test 22, 301–303 (2006). https://doi.org/10.1007/s10836-006-7720-x
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DOI: https://doi.org/10.1007/s10836-006-7720-x