Abstract
This paper describes a non-recursive fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss–Jordan elimination method.
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Mrugalski, G., Rajski, J., Wang, C. et al. Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J Electron Test 23, 35–45 (2007). https://doi.org/10.1007/s10836-006-9524-4
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DOI: https://doi.org/10.1007/s10836-006-9524-4