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Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

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Abstract

This paper describes a measurement principle for calculating component values from measurements conducted under less than optimal conditions, as is the case in the IEEE Std 1149.4 environment. Also presented are equations that take into account switch resistances on the signal paths, the output resistance of the signal generator, and the loading effect caused by the input impedance of the voltmeter together with the pin capacitances in parallel to the voltmeter. In addition, the paper presents characterization methods to determine values for these impedances. The inaccuracies achieved in the impedance range from kΩ to MΩ are of the order of few percent.

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References

  1. Gorodetsky A (2005) Bridge for on-board and on-chip 1149.4-compliant testability. 4th IEEE International Board Test Workshop

  2. IEEE Std 1149.4-1999 (2000) Standard for a mixed signal test bus. IEEE USA

  3. Saikkonen T, Voutilainen J, Moilanen M (2004) Calculating the values of passive components in 1149.4 environment. 3rd IEEE International Board Test Workshop

  4. Sunter S, Filliter K, Woo J, McHugh P (2001) A general purpose 1149.4 IC with HF analog test capabilities. Proceedings of the International Test Conference, pp 38–45

  5. Parker K, McDermid J, Oresjo S (1993) Structure and metrology for an analog testability bus. Proceedings of the International Test Conference, pp 309–322

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Acknowledgments

National Semiconductor Corp. is thanked for providing us with the STA400s. To JTAG Technologies we are grateful for the boundary-scan controller and the software. In addition, the Finnish Funding Agency for Technology and Innovation (Tekes), Nokia and Elektrobit Group are gratefully acknowledged for funding the Embedded Testing of Mixed-Signal Devices Project, under which this work was carried out. Finally, we wish to acknowledge Polar Electro.

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Authors and Affiliations

  1. Department of Electrical and Information Engineering, University of Oulu, P.O. Box 4500, 90014, Oulun yliopisto, Finland

    Teuvo Saikkonen & Markku Moilanen

Authors
  1. Teuvo Saikkonen
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  2. Markku Moilanen
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Correspondence to Teuvo Saikkonen.

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Responsible Editor: M. Lubaszewski

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Saikkonen, T., Moilanen, M. Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. J Electron Test 23, 569–579 (2007). https://doi.org/10.1007/s10836-007-5008-4

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  • DOI: https://doi.org/10.1007/s10836-007-5008-4

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