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Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X–Y Zoning Method

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Abstract

We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X–Y zoning method. In the method, we could implement a diagnosis procedure based on a diagnostic method for digital circuits because we developed a data processing method to handle data discretely. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC’97 benchmark circuits with hard faults and soft faults. These improved methods can reduce the diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.

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Acknowledgment

The authors would like to thank Professor Joan Figueras of Universitat Politècnica de Catalunya for his helpful comments for implementing the X–Y zoning method.

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Authors and Affiliations

  1. Graduate School of System Design, Tokyo Metropolitan University, 1-1 Minami-Osawa, Hachioji, Tokyo, 192-0397, Japan

    Yukiya Miura & Jiro Kato

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  1. Yukiya Miura
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  2. Jiro Kato
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Correspondence to Yukiya Miura.

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Responsible Editor: N. A. Touba

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Miura, Y., Kato, J. Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X–Y Zoning Method. J Electron Test 24, 223–233 (2008). https://doi.org/10.1007/s10836-007-5022-6

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  • DOI: https://doi.org/10.1007/s10836-007-5022-6

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