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Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy

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Abstract

This paper discusses an automated method to divide scan chains into multiple scan segments that are suitable for power-constrained at-speed testing using the skewed-load test application strategy. By dividing a circuit into multiple partitions, which can be tested independently, both power during shift and power during capture can be controlled. Despite activating one partition at a time, we show how through conscious construction of scan segments, high transition fault coverage can be achieved, while reducing test time of the circuit and employing third party test generation tools.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, L8S 4K1, Canada

    Ho Fai Ko & Nicola Nicolici

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  1. Ho Fai Ko
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  2. Nicola Nicolici
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Correspondence to Ho Fai Ko.

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Responsible Editor: B. Al-Hashimi

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Ko, H.F., Nicolici, N. Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy. J Electron Test 24, 393–403 (2008). https://doi.org/10.1007/s10836-007-5036-0

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