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Test Technology Newsletter - October 2007

The Newsletter of the Test Technology Technical Council of the IEEE Computer Society

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Correspondence to Bruce Kim.

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Responsible Editor: B. Kim

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Kim, B. Test Technology Newsletter - October 2007. J Electron Test 23, 371–372 (2007). https://doi.org/10.1007/s10836-007-5046-y

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  • DOI: https://doi.org/10.1007/s10836-007-5046-y

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